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IDT72T20108L5BBI PDF预览

IDT72T20108L5BBI

更新时间: 2024-01-06 16:12:41
品牌 Logo 应用领域
艾迪悌 - IDT 先进先出芯片双倍数据速率
页数 文件大小 规格书
51页 478K
描述
2.5 VOLT HIGH-SPEED TeraSync? DDR/SDR FIFO 20-BIT/10-BIT CONFIGURATION

IDT72T20108L5BBI 技术参数

是否Rohs认证: 不符合生命周期:Obsolete
零件包装代码:BGA包装说明:17 X 17 MM, 1 MM PITCH, PLASTIC, BGA-208
针数:208Reach Compliance Code:not_compliant
ECCN代码:EAR99HTS代码:8542.32.00.71
风险等级:5.92最长访问时间:3.6 ns
其他特性:ALTERNATIVE MEMORY WIDTH 10备用内存宽度:10
最大时钟频率 (fCLK):200 MHz周期时间:5 ns
JESD-30 代码:S-PBGA-B208JESD-609代码:e0
长度:17 mm内存密度:1310720 bit
内存集成电路类型:OTHER FIFO内存宽度:20
湿度敏感等级:3功能数量:1
端子数量:208字数:65536 words
字数代码:64000工作模式:SYNCHRONOUS
最高工作温度:70 °C最低工作温度:
组织:64KX20可输出:YES
封装主体材料:PLASTIC/EPOXY封装代码:BGA
封装等效代码:BGA208,16X16,40封装形状:SQUARE
封装形式:GRID ARRAY并行/串行:PARALLEL
峰值回流温度(摄氏度):225电源:1.5/2.5,2.5 V
认证状态:Not Qualified座面最大高度:1.97 mm
最大待机电流:0.05 A子类别:FIFOs
最大压摆率:0.06 mA最大供电电压 (Vsup):2.625 V
最小供电电压 (Vsup):2.375 V标称供电电压 (Vsup):2.5 V
表面贴装:YES技术:CMOS
温度等级:COMMERCIAL端子面层:Tin/Lead (Sn63Pb37)
端子形式:BALL端子节距:1 mm
端子位置:BOTTOM处于峰值回流温度下的最长时间:30
宽度:17 mmBase Number Matches:1

IDT72T20108L5BBI 数据手册

 浏览型号IDT72T20108L5BBI的Datasheet PDF文件第4页浏览型号IDT72T20108L5BBI的Datasheet PDF文件第5页浏览型号IDT72T20108L5BBI的Datasheet PDF文件第6页浏览型号IDT72T20108L5BBI的Datasheet PDF文件第8页浏览型号IDT72T20108L5BBI的Datasheet PDF文件第9页浏览型号IDT72T20108L5BBI的Datasheet PDF文件第10页 
IDT72T2098/108/118/128 2.5V HIGH-SPEED TeraSync™ DDR/SDR FIFO 20-BIT/10-BIT CONFIGURATIONS  
32K x 20/64K x 10, 64K x 20/128K x 10, 128K x 20/256K x 10, 256K x 20/512K x 10  
COMMERCIAL AND INDUSTRIAL  
TEMPERATURERANGES  
PINDESCRIPTION(CONTINUED)  
Symbol &  
Pin No.  
Name  
I/OTYPE  
Description  
RCS  
(F14)  
Read Chip  
Select  
HSTL-LVTTL RCSprovidessynchronousenable/disablecontrolof thereadportandHigh-Impedancecontrolofthe  
INPUT  
Qndataoutputs,synchronoustoRCLK. WhenusingRCS theOEpinmustbetiedLOW. DuringMaster  
orPartialResettheRCSinputisdontcare,ifOEisLOWthedataoutputswillbeLow-Impedanceregardless  
ofRCS.  
REN  
(F16)  
ReadEnable  
HSTL-LVTTL WhenLOWandinDDRmode,RENalongwitharisingandfallingedgeofRCLKwillsenddatainFIFO  
INPUT  
memorytothe outputregisterandreadthe currentdata inoutputregister. InSDRmode data willonly  
be read on the rising edge of RCLK only.  
(1)  
RSDR  
(L2)  
ReadSingle  
DataRate  
LVTTL  
INPUT  
WhenLOW,thisinputpinsetsthereadporttoSingleDataClockmode. WhenHIGH,thereadportwill  
operateinDoubleDataClockmode.ThispinmustbetiedeitherHIGHorLOWandcannottoggleduring  
operation.  
RT  
(F15)  
Retransmit  
HSTL-LVTTL RTassertedontherisingedgeofRCLKinitializesthereadpointertothefirstlocationinmemory.EFflag  
INPUT  
issettoLOW(ORtoHIGHinFWFTmode).Thewritepointer,offsetregisters,andflagsettingsarenot  
affected.IfamarkhasbeensetviatheMARKinputpin,thenthereadpointerwillinitializetothemarklocation  
when RT is asserted.  
SCLK  
(H15)  
SerialClock  
LVTTL  
INPUT  
ArisingedgeofSCLKwillclocktheserialdatapresentontheSIinputintotheoffsetregistersprovided  
thatSENisenabled.ArisingedgeofSCLKwillalsoreaddataoutoftheoffsetregistersprovidedthatSREN  
isenabled.  
SEN  
(J15)  
SerialInput  
Enable  
HSTL-LVTTL SENusedinconjunctionwithSIandSCLKenablesserialloadingoftheprogrammableflagoffsets.  
INPUT  
SREN  
(J16)  
Serial Read  
Enable  
HSTL-LVTTL SRENusedinconjunctionwithSOandSCLKenablesserialreadingoftheprogrammableflagoffsets.  
INPUT  
SI  
(H16)  
SerialInput  
SerialOutput  
JTAGClock  
HSTL-LVTTL Thisinputpinisusedtoloadserialdataintotheprogrammableflagoffsets.UsedinconjunctionwithSEN  
INPUT  
and SCLK.  
SO  
(K15)  
HSTL-LVTTL Thisoutputpinisusedtoreaddatafromtheprogrammableflagoffsets.UsedinconjunctionwithSREN  
OUTPUT and SCLK.  
(2)  
TCK  
HSTL-LVTTL ClockinputforJTAGfunction.Oneoffourterminals requiredbyIEEEStandard1149.1-1990.Test  
(F1)  
INPUT  
operationsofthedevicearesynchronoustoTCK.DatafromTMSandTDIaresampledontherisingedge  
ofTCKandoutputschangeonthefallingedgeofTCK.IftheJTAGfunctionisnotusedthissignalneeds  
tobe tiedtoGND.  
(2)  
TDI  
JTAGTestData HSTL-LVTTL One of four terminals required by IEEE Standard 1149.1-1990. During the JTAG boundary scan  
(E2)  
Input  
INPUT  
operation,testdataseriallyloadedviatheTDIontherisingedgeofTCKtoeithertheInstructionRegister,  
IDRegisterandBypass Register.Aninternalpull-upresistorforces TDIHIGHifleftunconnected.  
(2)  
TDO  
JTAGTestData HSTL-LVTTL One of four terminals required by IEEE Standard 1149.1-1990. During the JTAG boundary scan  
(F3)  
Output  
OUTPUT  
operation,testdataseriallyloadedoutputviatheTDOonthefallingedgeofTCKfromeithertheInstruction  
Register,IDRegisterandBypassRegister.Thisoutputishighimpedanceexceptwhenshifting,whilein  
SHIFT-DR and SHIFT-IR controller states.  
TMS(2)  
(F2)  
JTAGMode  
Select  
HSTL-LVTTL TMSisaserialinputpin.OneoffourterminalsrequiredbyIEEEStandard1149.1-1990.TMSdirectsthe  
INPUT thedevicethroughitsTAPcontrollerstates.Aninternalpull-upresistorforcesTMSHIGHifleftunconnected.  
HSTL-LVTTL TRST is an asynchronous reset pin for the JTAG controller. The JTAG TAP controller does not  
(2)  
TRST  
JTAGReset  
(E3)  
INPUT  
automaticallyresetuponpower-up,thusitmustberesetbyeitherthissignalorbysettingTMS=HIGH  
forfiveTCKcycles.IftheTAPcontrollerisnotproperlyresetthentheFIFOoutputswillalwaysbeinhigh-  
impedance.IftheJTAGfunctionisusedbuttheuserdoesnotwanttouseTRST,thenTRSTcanbetied  
withMRStoensureproperFIFOoperation.IftheJTAGfunctionisnotusedthenthissignalneedstobe  
tiedtoGND.Aninternalpull-upresistorforcesTRSTHIGHifleftunconnected.  
WCLK  
(G1)  
WriteClock  
HSTL-LVTTL InputclockwhenusedinconjunctionwithWENforwritingdataintotheFIFOmemory.  
INPUT  
WCS  
(H2)  
WriteChipSelect HSTL-LVTTL The WCS pin an be regarded as a second WEN input, enabling/disabling write operations.  
INPUT  
WEN  
(H1)  
WriteEnable  
HSTL-LVTTL WhenLOWandinDDRmode,WENalongwitharisingandfallingedgeofWCLKwillwritedataintothe  
INPUT  
FIFO memory. In SDR mode data will only be read on the rising edge of RCLK only.  
7

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