5秒后页面跳转
IDT71V25781S183PF9 PDF预览

IDT71V25781S183PF9

更新时间: 2024-01-19 21:52:57
品牌 Logo 应用领域
艾迪悌 - IDT 静态存储器内存集成电路
页数 文件大小 规格书
22页 618K
描述
Cache SRAM, 256KX18, 3.3ns, CMOS, PQFP100, 14 X 20 MM, 1.40 MM HEIGHT, PLASTIC, TQFP-100

IDT71V25781S183PF9 技术参数

是否Rohs认证: 不符合生命周期:Obsolete
零件包装代码:QFP包装说明:LQFP,
针数:100Reach Compliance Code:compliant
ECCN代码:3A991.B.2.AHTS代码:8542.32.00.41
风险等级:5.92最长访问时间:3.3 ns
其他特性:PIPELINED ARCHITECTUREJESD-30 代码:R-PQFP-G100
JESD-609代码:e0长度:20 mm
内存密度:4718592 bit内存集成电路类型:CACHE SRAM
内存宽度:18湿度敏感等级:3
功能数量:1端子数量:100
字数:262144 words字数代码:256000
工作模式:SYNCHRONOUS最高工作温度:70 °C
最低工作温度:组织:256KX18
封装主体材料:PLASTIC/EPOXY封装代码:LQFP
封装形状:RECTANGULAR封装形式:FLATPACK, LOW PROFILE
并行/串行:PARALLEL峰值回流温度(摄氏度):240
认证状态:Not Qualified座面最大高度:1.6 mm
最大供电电压 (Vsup):3.465 V最小供电电压 (Vsup):3.135 V
标称供电电压 (Vsup):3.3 V表面贴装:YES
技术:CMOS温度等级:COMMERCIAL
端子面层:TIN LEAD端子形式:GULL WING
端子节距:0.65 mm端子位置:QUAD
处于峰值回流温度下的最长时间:20宽度:14 mm
Base Number Matches:1

IDT71V25781S183PF9 数据手册

 浏览型号IDT71V25781S183PF9的Datasheet PDF文件第2页浏览型号IDT71V25781S183PF9的Datasheet PDF文件第3页浏览型号IDT71V25781S183PF9的Datasheet PDF文件第4页浏览型号IDT71V25781S183PF9的Datasheet PDF文件第5页浏览型号IDT71V25781S183PF9的Datasheet PDF文件第6页浏览型号IDT71V25781S183PF9的Datasheet PDF文件第7页 
128K X 36, 256K X 18  
IDT71V25761S  
IDT71V25781S  
IDT71V25761SA  
IDT71V25781SA  
3.3VSynchronousSRAMs  
2.5V I/O, Pipelined Outputs,  
Burst Counter, Single Cycle Deselect  
Features  
Description  
128K x 36, 256K x 18 memory configurations  
TheIDT71V25761/781arehigh-speedSRAMs organizedas 128K  
x 36/256K x 18. The IDT71V25761/781 SRAMs contain write, data,  
addressandcontrolregisters. InternallogicallowstheSRAMtogenerate  
aself-timedwritebaseduponadecisionwhichcanbeleftuntiltheendof  
thewritecycle.  
Supports high system speed:  
Commercial:  
– 200MHz 3.1ns clock access time  
CommercialandIndustrial:  
– 183MHz 3.3ns clock access time  
– 166MHz 3.5ns clock access time  
LBO input selects interleaved or linear burst mode  
Theburstmodefeatureoffersthehighestlevelofperformancetothe  
systemdesigner,astheIDT71V25761/718canprovidefourcyclesofdata  
forasingleaddress presentedtotheSRAM. Aninternalburstaddress  
Self-timedwritecyclewithglobalwritecontrol(GW),bytewrite counteracceptsthefirstcycleaddressfromtheprocessor,initiatingthe  
enable (BWE), and byte writes (BWx)  
3.3V core power supply  
Power down controlled by ZZ input  
2.5V I/O  
Optional - Boundary Scan JTAG Interface (IEEE 1149.1  
Compliant)  
Packaged in a JEDEC Standard 100-pin plastic thin quad  
accesssequence.Thefirstcycleofoutputdatawillbepipelinedforone  
cycle before it is available on the next rising clock edge. If burst mode  
operationisselected(ADV=LOW),thesubsequentthreecyclesofoutput  
datawillbeavailabletotheuseronthenextthreerisingclockedges. The  
orderofthesethreeaddressesaredefinedbytheinternalburstcounter  
andthe LBO inputpin.  
TheIDT71V25761/781SRAMsutilizeIDT’slatesthigh-performance  
flatpack(TQFP),119ballgridarray(BGA)and165finepitchball CMOSprocessandarepackagedinaJEDECstandard14mmx20mm  
grid array  
100-pinthinplasticquadflatpack(TQFP)aswellasa119 ballgridarray  
(BGA) and 165 fine pitch ball grid array (fBGA).  
PinDescriptionSummary  
A0-A17  
Address Inputs  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Input  
Output  
Input  
Input  
I/O  
Synchronous  
Synchronous  
Synchronous  
Asynchronous  
Synchronous  
Synchronous  
Synchronous  
N/A  
Chip Enable  
CE  
CS  
0
, CS  
1
Chip Selects  
Output Enable  
OE  
GW  
Global Write Enable  
Byte Write Enable  
Individual Byte Write Selects  
Clock  
BWE  
BW , BW  
(1)  
1
2
, BW  
3
, BW  
4
CLK  
Burst Address Advance  
Address Status (Cache Controller)  
Address Status (Processor)  
Linear / Interleaved Burst Order  
Test Mode Select  
Test Data Input  
Synchronous  
Synchronous  
Synchronous  
DC  
ADV  
ADSC  
ADSP  
LBO  
TMS  
TDI  
Synchronous  
Synchronous  
N/A  
TCK  
TDO  
TRST  
ZZ  
Test Clock  
Test Data Output  
Synchronous  
Asynchronous  
Asynchronous  
Synchronous  
N/A  
JTAG Reset (Optional)  
Sleep Mode  
I/O  
0
-I/O31, I/OP1-I/OP4  
DD, VDDQ  
SS  
Data Input / Output  
Core Power, I/O Power  
Ground  
V
Supply  
Supply  
V
N/A  
5297 tbl 01  
NOTE:  
1. BW3 and BW4 are not applicable for the IDT71V25781.  
JUNE 2003  
1
©2000IntegratedDeviceTechnology,Inc.  
DSC-5297/03  

与IDT71V25781S183PF9相关器件

型号 品牌 描述 获取价格 数据表
IDT71V25781S183PFG IDT Cache SRAM, 256KX18, 3.3ns, CMOS, PQFP100, 14 X 20 MM, PLASTIC, TQFP-100

获取价格

IDT71V25781S183PFGI IDT Cache SRAM, 256KX18, 3.3ns, CMOS, PQFP100, 14 X 20 MM, PLASTIC, TQFP-100

获取价格

IDT71V25781S183PFI IDT 128K X 36, 256K X 18 3.3V Synchronous SRAMs 2.5V I/O, Pipelined Outputs, Burst Counter, Si

获取价格

IDT71V25781S183PFI9 IDT Cache SRAM, 256KX18, 3.3ns, CMOS, PQFP100, 14 X 20 MM, 1.40 MM HEIGHT, PLASTIC, TQFP-100

获取价格

IDT71V25781S200BG IDT 128K X 36, 256K X 18 3.3V Synchronous SRAMs 2.5V I/O, Pipelined Outputs, Burst Counter, Si

获取价格

IDT71V25781S200BG8 IDT Cache SRAM, 256KX18, 3.1ns, CMOS, PBGA119, 14 X 22 MM, PLASTIC, BGA-119

获取价格