IDT54/74FCT16374AT/CT/ET
FASTCMOS16-BITREGISTER(3-STATE)
MILITARYANDINDUSTRIALTEMPERATURERANGES
POWERSUPPLYCHARACTERISTICS
Symbol
Parameter
QuiescentPowerSupplyCurrent
TTL Inputs HIGH
TestConditions(1)
Min.
Typ.(2)
Max.
Unit
ΔICC
VCC = Max.
—
0.5
1.5
mA
(3)
VIN = 3.4V
ICCD
IC
DynamicPowerSupplyCurrent(4)
VCC = Max.
OutputsOpen
xOE = GND
OneInputToggling
50% Duty Cycle
VIN = VCC
VIN = GND
—
60
100
µ A /
MHz
TotalPowerSupplyCurrent(6)
VCC = Max.
OutputsOpen
fCP = 10MHz
VIN = VCC
VIN = GND
—
—
—
—
0.6
1.1
3
1.5
3
mA
50% Duty Cycle
xOE = GND
fi = 5MHz
50% Duty Cycle
VIN = 3.4V
VIN = GND
OneBitToggling
(5)
VCC = Max.
VIN = VCC
VIN = GND
5.5
OutputsOpen
fCP = 10MHz
50% Duty Cycle
(5)
xOE = GND
SixteenBitsToggling
fi = 2.5MHz
VIN = 3.4V
VIN = GND
7.5
19
50% Duty Cycle
NOTES:
1. For conditions shown as Min. or Max., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at VCC = 5.0V, +25°C ambient.
3. Per TTL driven input (VIN = 3.4V). All other inputs at VCC or GND.
4. This parameter is not directly testable, but is derived for use in Total Power Supply Calculations.
5. Values for these conditions are examples of the ICC formula. These limits are guaranteed but not tested.
6. IC = IQUIESCENT + IINPUTS + IDYNAMIC
IC = ICC + ΔICC DHNT + ICCD (fCPNCP/2 + fiNi)
ICC = Quiescent Current (ICCL, ICCH and ICCZ)
ΔICC = Power Supply Current for a TTL High Input (VIN = 3.4V)
DH = Duty Cycle for TTL Inputs High
NT = Number of TTL Inputs at DH
ICCD = Dynamic Current Caused by an Input Transition Pair (HLH or LHL)
fCP = Clock Frequency for Register Devices (Zero for Non-Register Devices)
NCP = Number of Clock Inputs at fCP
fi = Input Frequency
Ni = Number of Inputs at fi
4