5秒后页面跳转
HT32G470J500 PDF预览

HT32G470J500

更新时间: 2024-04-09 18:56:32
品牌 Logo 应用领域
华新科技 - WALSIN /
页数 文件大小 规格书
12页 3424K
描述
1210, X8G, 47pF, 50Vdc

HT32G470J500 数据手册

 浏览型号HT32G470J500的Datasheet PDF文件第6页浏览型号HT32G470J500的Datasheet PDF文件第7页浏览型号HT32G470J500的Datasheet PDF文件第8页浏览型号HT32G470J500的Datasheet PDF文件第10页浏览型号HT32G470J500的Datasheet PDF文件第11页浏览型号HT32G470J500的Datasheet PDF文件第12页 
Multilayer Ceramic Capacitors  
Approval Sheet  
No.  
Item  
Test Condition  
Requirements  
* Conduct the five cycles according to the temperatures and  
time.  
12. Temperature  
Cycle  
* No remarkable damage.  
* Cap change:  
Step  
Temp. (°C)  
Min. operating temp. +0/-3  
Room temp.  
Time (min.)  
30±3  
X8G: within ±2.5or ±0.25pF whichever is larger.  
X8R: within ±7.5%  
1
2
3
4
2~3  
* Q/D.F., I.R. and dielectric strength: To meet initial requirements.  
Max. operating temp. +3/-0  
Room temp.  
30±3  
2~3  
*Before initial measurement (Class II only): To apply de-aging  
at 150°C for 1hr then set for 24±2 hrs at room temp .  
* Cap. / DF(Q) / I.R. Measurement to be made after de-aging  
at 150°C for 1hr then set for 24±2 hrs at room temp .  
* Test temp.: 40±2°C  
13. Humidity  
(Damp Heat)  
Steady State  
* No remarkable damage.  
* Humidity: 90~95% RH  
* Cap change: X8G: within ±5.0% or ±0.5pF whichever is larger.  
X8R: within ±12.5%  
* Test time: 500+24/-0hrs.  
* Before initial measurement (Class II only): To apply de-aging * Q/D.F. value:  
at 150°C for 1hr then set for 24±2 hrs at room temp .  
* Cap. / DF(Q) / I.R. Measurement to be made after de-aging  
at 150°C for 1hr then set for 24±2 hrs at room temp .  
X8G: Cap30pF, Q350; 10pFCap<30pF, Q275+2.5C  
Cap<10pF; Q200+10C  
X8R: 7.5%  
* I.R.: 1Gor RxC50-F whichever is smaller.  
14. Humidity  
(Damp Heat)  
Load  
* Test temp.: 40±2°C  
* No remarkable damage.  
* Humidity: 90~95%RH  
* Cap change: X8G: within ±7.5% or ±0.75pF whichever is larger.  
X8R: within ±12.5%  
* Test time: 500+24/-0 hrs.  
* To apply voltagerated voltage  
* Before initial measurement (Class II only): To apply de-aging  
at 150°C for 1hr then set for 24±2 hrs at room temp .  
* Cap. / DF(Q) / I.R. Measurement to be made after de-aging  
at 150°C for 1hr then set for 24±2 hrs at room temp .  
* Test temp.:  
* Q/D.F. value:  
X8G: Cap30pF, Q200; Cap<30pF, Q100+10/3C  
X8R: 7.5%  
* I.R.: 500Mor RxC25-F whichever is smaller.  
15. High  
Temperature  
Load  
* No remarkable damage.  
X8G, X8R: 150±3°C  
* Cap change: X8G: within ±3.0% or ±0.3pF whichever is larger.  
X8R: within ±12.5%  
* To apply voltage: 200% of rated voltage.  
* Test time: 1000+24/-0 hrs.  
(Endurance)  
* Q/D.F. value:  
* Before initial measurement (Class II only): To apply de-aging X8G: Cap30pF, Q350  
at 150°C for 1hr then set for 24±2 hrs at room temp .  
* Cap. / DF(Q) / I.R. Measurement to be made after de-aging at  
150°C for 1hr then set for 24±2 hrs at room temp.  
10pFCap<30pF, Q275+2.5C  
Cap<10pF, Q200+10C  
X8R: 7.5%  
* I.R.: 1Gor RxC50-F whichever is smaller.  
* "Room condition" Temperature: 15 to 35°C, Relativ e humidity: 25 to 75%, Atmospheric pressure: 86 to 106kPa.  
Page 9 of 12  
ASC_High Temperature Cap_(HT)_026C_AS  
Feb. 2021  

与HT32G470J500相关器件

型号 品牌 描述 获取价格 数据表
HT32G471J500 WALSIN 1210, X8G, 470pF, 50Vdc

获取价格

HT32G472J500 WALSIN 1210, X8G, 4700pF, 50Vdc

获取价格

HT32G680J500 WALSIN 1210, X8G, 68pF, 50Vdc

获取价格

HT32G681J500 WALSIN 1210, X8G, 680pF, 50Vdc

获取价格

HT32G682J500 WALSIN 1210, X8G, 6800pF, 50Vdc

获取价格

HT-32R TECCOR DIAC, 37V V(BO) Max, DO-35

获取价格