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HMS25632M8B-17 PDF预览

HMS25632M8B-17

更新时间: 2022-04-23 23:00:11
品牌 Logo 应用领域
HANBIT 静态存储器
页数 文件大小 规格书
9页 233K
描述
SRAM MODULE 1Mbyte (256K x 32-Bit) , 72-Pin

HMS25632M8B-17 数据手册

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HANBit  
HMS25632M8B/Z8B  
( /CE Controlled )  
tRC  
TIMING WAVEFORM OF READ CYCLE  
Address  
/CE  
tHZ(3,4,5)  
tAA  
tCO  
tLZ(4,5)  
tOHZ  
tOE  
/OE  
tOH  
tOLZ  
High-Z  
Data Out  
Data Valid  
tPD  
tPU  
50%  
lCC  
lSB  
Vcc Supply  
Current  
50%  
(Read Cycle)  
Notes  
1. /WE is high for read cycle.  
2. All read cycle timing is referenced from the last valid address to first transition address.  
3. tHZ and tOHZ are defined as the time at which the outputs achieve the open circuit condition and are not referenced to VOH or VOL  
levels.  
4. At any given temperature and voltage condition, tHZ (max.) is less than tLZ (min.) both for a given device and from device to device.  
5. Transition is measured ± 200mV from steady state voltage with Load (B). This parameter is sampled and not 100% tested.  
6. Device is continuously selected with /CE = VIL.  
7. Address valid prior to coincident with /CE transition low.  
(/OE = Clock )  
TIMING WAVEFORM OF WRITE CYCLE  
tWC  
Address  
/OE  
tAW  
tWR(5)  
tCW(3)  
/CE  
tAS(4)  
tWP(2)  
/WE  
tDW  
tDH  
High-Z  
Data In  
Data Valid  
tOHZ(6)  
Data Out  
High-Z  
6
HANBit Electronics Co.,Ltd.  

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