Sep 2009
BVDSS = 600 V
DS(on) typ = 10 Ω
R
HFD1N60S / HFU1N60S
600V N-Channel MOSFET
ID = 1.0 A
D-PAK
I-PAK
2
FEATURES
1
1
3
2
3
Originative New Design
HFD1N60S
HFU1N60S
Superior Avalanche Rugged Technology
Robust Gate Oxide Technology
Very Low Intrinsic Capacitances
Excellent Switching Characteristics
Unrivalled Gate Charge : 3.0 nC (Typ.)
Extended Safe Operating Area
Lower RDS(ON) : 10 Ω (Typ.) @VGS=10V
100% Avalanche Tested
1.Gate 2. Drain 3. Source
Absolute Maximum Ratings
TC=25℃ unless otherwise specified
Symbol
Parameter
Value
Units
V
VDSS
Drain-Source Voltage
Drain Current
600
1.0
0.6
4.0
±30
33
ID
– Continuous (TC = 25℃)
– Continuous (TC = 100℃)
A
Drain Current
A
IDM
VGS
EAS
IAR
Drain Current
– Pulsed
(Note 1)
A
Gate-Source Voltage
V
Single Pulsed Avalanche Energy
Avalanche Current
(Note 2)
(Note 1)
(Note 1)
(Note 3)
mJ
A
1.0
2.8
4.5
EAR
dv/dt
PD
Repetitive Avalanche Energy
Peak Diode Recovery dv/dt
mJ
V/ns
Power Dissipation (TA = 25℃) *
Power Dissipation (TC = 25℃)
2.5
28
W
W
- Derate above 25℃
0.22
W/℃
℃
TJ, TSTG
TL
Operating and Storage Temperature Range
-55 to +150
Maximum lead temperature for soldering purposes,
1/8” from case for 5 seconds
300
℃
Thermal Resistance Characteristics
Symbol
Parameter
Typ.
Max.
Units
RθJC
RθJA
Junction-to-Case
--
--
--
4.53
Junction-to-Ambient*
Junction-to-Ambient
50
℃/W
110
RθJA
* When mounted on the minimum pad size recommended (PCB Mount)
◎ SEMIHOW REV.A0,Sep 2009