HCPL0600, HCPL0601, HCPL0611, HCPL0637, HCPL0638, HCPL0639
SAFETY AND INSULATIONS RATING
As per DIN EN/IEC 60747−5−5, this optocoupler is suitable for “safe electrical insulation” only within the safety limit data.
Compliance with the safety ratings shall be ensured by means of protective circuits.
Parameter
Characteristics
Installation Classifications per DIN VDE 0110/1.89 Table 1,
For Rated Mains Voltage
< 150 VRMS
< 300 VRMS
I–IV
I–III
Climatic Classification
40/85/21
2
Pollution Degree (DIN VDE 0110/1.89)
Comparative Tracking Index
175
Symbol
Parameter
Input−to−Output Test Voltage, Method A, V
Value
Unit
V
PR
x 1.6 = V
,
904
Vpeak
IORM
PR
Type and Sample Test with t = 10 s, Partial Discharge < 5 pC
m
Input−to−Output Test Voltage, Method B, V
x 1.875 = V
,
1060
Vpeak
IORM
PR
100% Production Test with t = 1 s, Partial Discharge < 5 pC
m
Maximum Working Insulation Voltage
Highest Allowable Over−Voltage
External Creepage
565
4,000
≥ 4
V
Vpeak
Vpeak
mm
IORM
V
IOTM
≥ 4
External Clearance
mm
≥ 0.4
150
DTI
Distance Through Insulation (Insulation Thickness)
mm
T
S
°C
Case Temperature (Note 1)
Input Current (Note 1)
Output Power (Note 1)
200
300
mA
mW
ꢁ
I
S,INPUT
P
S,OUTPUT
9
R
Insulation Resistance at T , V = 500 V (Note 1)
> 10
IO
S
IO
1. Safety limit values – maximum values allowed in the event of a failure.
ABSOLUTE MAXIMUM RATINGS (No Derating Required up to 85°C)
Symbol
Parameter
Value
Units
°C
T
Storage Temperature
Operating Temperature
Junction Temperature
−40 to +125
−40 to +85
−40 to +125
STG
OPR
T
°C
T
J
°C
EMITTER
I
DC/Average Forward Input Current
Each Channel
50
mA
V
F
V
Enable Input Voltage
Not to exceed VCC by more than 500 mV
Single Channel
Devices Only
5.5
E
V
Reverse Input Voltage
Power Dissipation
Each Channel
Each Channel
5.0
45
V
R
P
mW
I
DETECTOR
V
CC
Supply Voltage
7.0
V
(1 minute max)
I
Output Current
Each Channel
Each Channel
Each Channel
15
7.0
85
mA
V
O
V
P
Output Voltage (each channel)
Collector Output Power Dissipation
O
O
mW
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality
should not be assumed, damage may occur and reliability may be affected.
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