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GRT1555C1H431GA02# PDF预览

GRT1555C1H431GA02#

更新时间: 2023-09-03 20:31:25
品牌 Logo 应用领域
村田 - MURATA 医疗医疗器械
页数 文件大小 规格书
31页 1828K
描述
汽车[信息娱乐 / 舒适设备],工业设备,植入式以外的医疗器械设备 [GHTF A/B/C]

GRT1555C1H431GA02# 数据手册

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Specifications and Test Methods  
No Item  
19 Voltage proof  
Specification  
Test MethodRef. Standard:AEC-Q200)  
250% of the rated voltage  
1s to 5s  
No defects or abnormalities.  
Test Voltage  
Applied Time  
Charge/discharge current 50mA max.  
Appearance  
Capacitance or Capacitance Change  
No defects or abnormalities.  
Capacitance Change:Within +/-5%  
Within the specified initial value.  
More than 10000MΩ  
Mounting method  
Pressurization Method  
Flexure  
Reflow solder the capacitor on the test substrate  
Shown in Fig.2  
2mm  
20 Board Flex  
Q or D.F.  
I.R.(Room Temp.)  
Holding Time  
60s  
Appearance  
Capacitance  
Q or D.F.  
No defects or abnormalities.  
Within the specified initial value.  
Within the specified initial value.  
More than 10000MΩ  
Mounting method  
Applied Force  
Holding Time  
Solder the capacitor on the test substrate  
2N  
60s  
21 Terminal Strength  
22 Beam Load Test  
I.R.(Room Temp.)  
Speed supplied the Stress Load  
Destruction Value: More than 8N  
0.5mm/s  
Placement diagram  
No bias  
Nominal values of the temperature coefficientis is  
The capacitance change should be measured after 5 min at each specified temp. stage.  
Capacitance value as a reference is the value in "*" marked step.  
23 Temperature  
Characteristics of  
Capacitance  
shown in Rated value. But, the Capacitance Change  
under Reference Temperature is shown inTable A.  
Capacitance Drift: Within +/-0.2% or +/-0.05pF  
(Whichever is larger.)  
Capacitance Drift  
The capacitance drift is calculated by dividing the differences between the maximum and minimum  
measured values in the step 1,3 and 5 by the cap. value in step 3.  
Less than 1.0Vrms (Refer to the individual data sheet)  
Measurement Voltage  
Temperature Step  
GRT1555C1H431GA02-01A  
4

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