Datasheet > GRM32DR71E335KA01L

GRM32DR71E335KA01L

更新时间： 2022-06-24 15:43:58

品牌	Logo	应用领域
村田 - MURATA		/
页数	文件大小	规格书
30页	780K
描述
Chip Multilayer Ceramic Capacitors for General Purpose

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Item

Specification

Test Method (Ref. Standard:JIS C 5101, IEC60384)

Solder the capacitor on the test substrate shown in Fig.3.

No.

15 High

Appearance No defects or abnormalities.

40+/-2℃

Temperature

High Humidity

(Steady)

Test Temperature :

Test Humidity :

Test Time :

Capacitance Within +/-12.5%

Change

90%RH to 95%RH

500+/-12h

Q or D.F.

DF:0.05 max.

Test Voltage :

Charge/Discharge Current :

Rated Voltage

50mA max.

I.R.

More than 500MΩ or 25Ω･F (Whichever is smaller)

Let sit for 24+/-2hours at room temperature, then measure.

Post-treatment :

16 Durability

Appearance No defects or abnormalities.

Solder the capacitor on the test substrate shown in Fig.3.

Test Temperature :

Test Time :

Test Voltage :

Maximum Operating Temperature+/-3℃

1000+/-12h

200% of the rated voltage

50mA max.

Capacitance Within +/-12.5%

Change

Charge/Discharge Current :

Q or D.F.

DF:0.05 max.

Apply the test voltage at the test temperature for 1hour and then let sit for 24+/-2hours at room temperature, then measure.

Let sit for 24+/-2hours at room temperature, then measure.

I.R.

More than 1000MΩ or 50Ω･F (Whichever is smaller)

Pre-treatment :

Post-treatment :

GRM32DR71E335KA01-01A

1 2 345 6 7...30

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