Datasheet > GRM2165C1H131JA01

GRM2165C1H131JA01

更新时间： 2022-02-26 09:22:58

品牌	Logo	应用领域
村田 - MURATA		/
页数	文件大小	规格书
30页	829K
描述
Chip Monolithic Ceramic Capacitor for General

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■ Specifications and Test Methods

Test Method

(Ref. Standard:JIS C 5101, IEC60384）

Item

Rated Voltage

Specification

Shown in Rated value.

The rated voltage is defined as the maximum voltage

which may be applied continuously to the capacitor.

When AC voltage is superimposed on DC voltage,

V^P-Por V^O-P, whichever is larger, should be maintained

within the rated voltage range.

Appearance

Dimension

No defects or abnormalities.

Visual inspection.

Within the specified dimensions.

No defects or abnormalities.

Using calipers. (GRM02 size is based on Microscope)

Voltage proof

Measurement Point

Test Voltage

Between the terminations

300% of the rated voltage

(Temperature compensating type)

250% of the rated voltage

(High dielectric constant type)

: 1s to 5 s

Applied Time

Charge/discharge current : 50mA max.

Insulation Resistance(I.R.)

C≦0.047µF:More than 10000MΩ

C＞0.047µF:More than 500Ω·F

C:Nominal Capacitance

Measurement Point ꢀꢀ : Between the terminations

Measurement Voltage : DC Rated Voltage

Charging Time

: 2 min

Charge/discharge current : 50mA max.

Measurement Temperature : Room Temperature

Capacitance

Shown in Rated value.

Measurement Temperature : Room Temperature

Capacitance

C≦1000pF

C＞1000pF

Frequency

1.0+/-0.1MHz 0.5 to 5.0Vrms

1.0+/-0.1kHz 1.0+/-0.2Vrms

Voltage

30pF and over:Q≧1000

30pF and below:Q≧400+20C

C:Nominal Capacitance(pF)

Temperature

No bias

Nominal values of the temperature coefficient is shown in Rated value. The capacitance change should be measured after 5 min

at each specified temp. stage.

Characteristics

of Capacitance

But,the Capacitance Change under 25℃ is shown in Table A.

In case of applying voltage, the capacitance change should be

measured after 1 min with applying voltage in equilibration of

each temp. stage.

Capacitance Drift

Within +/-0.2% or +/-0.05pF

(Whichever is larger.)

Capacitance value as a reference is the value in step 3.

The capacitance drift is calculated by dividing the differences

between the maximum and minimum measured values in the

step 1,3 and 5 by the cap. value in step 3.

Step

Temperature(C)

Reference Temp.+/-2

Min. Operating Temp.+/-3

Reference Temp.+/-2

Max. Operating Temp.+/-3

Reference Temp.+/-2

Adhesive Strength

of Termination

No removal of the terminations or other defect

should occur.

Solder the capacitor on the test substrate shown in Fig.3.

Type

Applied Force(N)

GRM02

GRM03

GRM15/GRM18

GRM21/GRM31/GRM32

Holding Time

10+/-1s

Applied Direction : In parallel with the test substrate and vertical with

the capacitor side.

JEMCGS-0015S

123 4 5 6 7...30

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与GRM2165C1H131JA01相关器件

型号	品牌	描述	获取价格	数据表
GRM2165C1H131JA01#	MURATA	民用设备,工业设备,移动设备,植入式以外的医疗器械设备 [GHTF A/B/C],汽车[信	获取价格
GRM2165C1H132JA01	MURATA	Chip Multilayer Ceramic Capacitors for General Purpose	获取价格
GRM2165C1H132JA01#	MURATA	民用设备,工业设备,移动设备,植入式以外的医疗器械设备 [GHTF A/B/C],汽车[信	获取价格
GRM2165C1H132JA01D	MURATA	Chip Multilayer Ceramic Capacitors for General Purpose	获取价格
GRM2165C1H132JA01J	MURATA	Chip Multilayer Ceramic Capacitors for General Purpose	获取价格
GRM2165C1H151GA01	MURATA	Chip Multilayer Ceramic Capacitors for General Purpose	获取价格

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