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GRM1885C2E510JW07

更新时间： 2022-02-26 12:26:38
品牌 Logo 应用领域
村田 - MURATA /
页数 文件大小 规格书
28页 1158K
描述
Chip Multilayer Ceramic Capacitors for General Purpose

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GRM1885C2E510JW07 数据手册

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Test Method  
(Ref. Standard:JIS C 5101, IEC60384）  
Item  
Specification  
No  
11 Adhesive Strength  
of Termination  
No removal of the terminations or other defect  
should occur.  
Solder the capacitor on the test substrate A shown in "Complement of Test  
method”.  
10N, 10+/-1s  
Applied Direction : In parallel with the test substrate and vertical with the  
capacitor side.  
12 Substrate  
Bending test  
Appearance No defects or abnormalities.  
Solder the capacitor on the test substrate B shown in "Complement of Test  
method”.  
Then apply the force in the direction shown in “Test Method of Substrate  
Bending test” of “Complement of Test method”.  
Capacitance Within +/-2% or +/-0.3pF (Whichever is larger)  
Change  
Flexureꢀ  
ꢀꢀꢀ:  
1mm  
Holding Time ꢀ  
Soldering Method  
:
5+/-1s  
:
Reflow soldering  
13  
Appearance No defects or abnormalities.  
Fix the capacitor to the supporting Test substrate A (glass epoxy board)  
shown in “Complement of Test method”.  
Temperature  
Sudden Change  
Perform the 5 cycles according to the four heat treatments  
shown in the following table.  
Capacitance Within +/-2% or +/-0.3pF (Whichever is larger)  
Change  
Time  
(min)  
Step  
Temp.(C)  
1
2
3
4
30+/-3  
Min.Operating Temp.+0/-3  
Room Temp  
Q
500 min.  
2 to 3  
30+/-3  
2 to 3  
Max.Operating Temp.+3/-0  
Room Temp  
I.R.  
Within the specified initial value.  
Exposure Time  
:
24+/-2h at room condition*.  
Voltage proof No defects.  
Humidity  
14  
Appearance No defects or abnormalities.  
Fix the capacitor to the supporting Test substrate A (glass epoxy board)  
(Steady state)  
shown in “Complement of Test method”.  
Capacitance Within +/-2% or +/-0.3pF (Whichever is larger)  
Change  
Test Temperature  
Test Humidity  
Test Time  
:
40+/-2℃  
:
90% to 95%RH  
500+24/-0h  
:
350 min.  
Exposure Time  
:
24+/-2h at room condition*.  
Q
More than 1000MΩ or 10MΩ・μF  
I.R.  
(Whichever is smaller)  
Voltage proof No defects.  
15 Durability  
Appearance No defects or abnormalities.  
Fix the capacitor to the supporting Test substrate A (glass epoxy board)  
shown in “Complement of Test method”.  
Test Temperature  
Test Time  
:
Max. Operating Temp. +/-3℃  
1000+48/-0h  
Capacitance Within +/-2% or +/-0.3pF (Whichever is larger)  
Change  
:
Applied Voltage  
:
150% of the rated voltage  
ꢀ(Rated voltage:DC200V,DC250V)  
120% of the rated voltage  
Q
350 min.  
ꢀ(Rated voltage:DC500V,DC630V,DC1kV,DC2kV)  
ꢀ(Rated voltage(7U only):DC3.15kV)  
I.R.  
More than 1000MΩ or 10MΩ・μF  
Charge/discharge current : 50mA max.  
Exposure Time 24+/-2h at room condition*.  
(Whichever is smaller)  
:
Voltage proof No defects.  
*Room Condition : Temperature:15 to 35°C, Relative humidity:45 to 75%, Atmosphere pressure:86 to 106kPa  
JEMCGS-04233D  
3
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