Datasheet > GRM0335C1H2R8CA01

GRM0335C1H2R8CA01

更新时间： 2022-02-26 10:10:11

品牌	Logo	应用领域
村田 - MURATA		/
页数	文件大小	规格书
30页	809K
描述
Chip Monolithic Ceramic Capacitor for General

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Test Method

(Ref. Standard:JIS C 5101, IEC60384）

Item

Appearance No defects or abnormalities.

Specification

Solder the capacitor on the test substrate shown in Fig.3.

High

Temperature

High Humidity

(Steady)

Capacitance Within +/-7.5% or +/-0.75pF

Test Temperature

Test Humidity

Test Time

: 40+/-2℃

Change

(Whichever is larger)

: 90%RH to 95%RH

: 500+/-12h

30pF and over:Q≧200

Applied Voltage

: DC Rated Voltage

30pF and below :Q≧100+10C/3

Charge/discharge current : 50mA max.

Exposure Time : 24+/-2h

C:Nominal Capacitance(pF)

I.R.

More than 500MΩ or 25Ω·F (Whichever is smaller)

Appearance No defects or abnormalities.

Capacitance Within +/-3% or +/-0.3pF

Solder the capacitor on the test substrate shown in Fig.3.

Durability

Test Temperature

Test Time

: Max. Operating Temp. +/-3℃

Change

(Whichever is larger)

: 1000+/-12h

Applied Voltage

200% of the rated voltage

30pF and over:Q≧350

Charge/discharge current : 50mA max.

Exposure Time 24+/-2h

10pF and over

30pF and below : Q≧275+5C/2

10pF and below : Q≧200+10C

C:Nominal Capacitance (pF)

I.R.

More than 1,000MΩ or 50Ω·F (Whichever is smaller)

Table A

Char.

Capacitance Change from 25C (%)

-55C

-30C

-10C

Max.

Min.

Max.

0.40

0.59

1.61

2.08

2.81

3.75

6.04

Min.

-0.17

-0.33

0.50

0.88

1.49

2.26

3.47

Max.

0.25

0.38

1.02

1.32

1.79

2.39

3.84

Min.

-0.11

-0.21

0.32

0.56

0.95

1.44

2.21

0.58

0.87

2.33

3.02

4.09

5.46

8.78

-0.24

-0.48

0.72

1.28

2.16

3.28

5.04

JEMCGS-0015S

1 2 345 6 7...30

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