Item
Specification
Test Method (Ref. Standard:JIS C 5101, IEC60384)
Solder the capacitor on the test substrate shown in Fig.3.
No.
15 High
Appearance No defects or abnormalities.
Temperature
High Humidity
(Steady)
Test Temperature :
Test Humidity :
Test Time :
40+/-2℃
Capacitance Within +/-7.5% or +/-0.75pF (Whichever is larger)
Change
90%RH to 95%RH
500+/-12h
Q or D.F.
Q≧100+10C/3 C:Nominal Capacitance(pF)
Test Voltage :
Rated Voltage
Charge/Discharge Current : 50mA max.
I.R.
More than 500MΩ or 25Ω・F (Whichever is smaller)
Let sit for 24+/-2hours at room temperature, then measure.
Post-treatment :
16 Durability
Appearance No defects or abnormalities.
Solder the capacitor on the test substrate shown in Fig.3.
Test Temperature :
Test Time :
Test Voltage :
Maximum Operating Temperature+/-3℃
Capacitance Within +/-3% or +/-0.3pF (Whichever is larger)
Change
1000+/-12h
200% of the rated voltage
Q or D.F.
Q≧200+10C C:Nominal Capacitance(pF)
Charge/Discharge Current : 50mA max.
I.R.
More than 1000MΩ or 50Ω・F (Whichever is smaller)
Let sit for 24+/-2hours at room temperature, then measure.
Post-treatment :
Table A Capacitance Change between at Reference Temp. and at each Temp. (%)
-55℃
-30℃
-10℃
Char.
5C
Max.
0.4
Max.
0.58
Min.
-0.24
Min.
-0.17
Max.
0.25
Min.
-0.11
GRM0115C1CR40BE11-01A