■ Specifications and Test Methods
No Item
Specification
Test Method(Ref. Standard:AEC-Q200)
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1 Pre-and Post-Stress
Electrical Test
Appearance
Capacitance Change
Q or D.F.
No defects or abnormalities.
Within +/-12.5%
Within the specified initial value.
Within the specified initial value.
Mounting method
Pre-treatment
Solder the capacitor on the test substrate
Heat treatment:Perform a heat treatment at 150+0/-10°C for 1hour and then let sit for 24+/-2hours
at room temperature, then measure.
150+/-3℃
2 High Temperature
Exposure (Storage)
I.R.(Room Temp.)
Test Temperature
Test Time
1000+/-12h
Post-treatment
Non treatment:Let sit for 24+/-2hours at room temperature, then measure.
Appearance
Capacitance Change
Q or D.F.
No defects or abnormalities.
Within +/-7.5%
Within the specified initial value.
Within the specified initial value.
Mounting method
Pre-treatment
Solder the capacitor on the test substrate
Heat treatment:Perform a heat treatment at 150+0/-10°C for 1hour and then let sit for 24+/-2hours
at room temperature, then measure.
1000cycles
3 Temperature Cycling
I.R.(Room Temp.)
Cycles
Temperature Cycling
Post-treatment
Per EIA-469
Non treatment:Let sit for 24+/-2hours at room temperature, then measure.
Appearance
No defects or abnormalities.
4 Destructive Physical
Analysis
GCJ31MR72A154MA01-02B
2