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GCH155R72A222KE01# PDF预览

GCH155R72A222KE01#

更新时间: 2023-09-03 20:38:14
品牌 Logo 应用领域
村田 - MURATA 医疗医疗器械
页数 文件大小 规格书
30页 1741K
描述
植入式医疗器械设备或医疗器械设备 [GHTF D]

GCH155R72A222KE01# 数据手册

 浏览型号GCH155R72A222KE01#的Datasheet PDF文件第1页浏览型号GCH155R72A222KE01#的Datasheet PDF文件第2页浏览型号GCH155R72A222KE01#的Datasheet PDF文件第4页浏览型号GCH155R72A222KE01#的Datasheet PDF文件第5页浏览型号GCH155R72A222KE01#的Datasheet PDF文件第6页浏览型号GCH155R72A222KE01#的Datasheet PDF文件第7页 
Specifications and Test Methods  
No Item  
9 Solderability  
Specification  
Test Method  
95% of the terminations is to be soldered evenly and continuously.  
Test Method  
Flux  
Preheat  
Kind of Solder  
Test Temperature  
Test Time  
Solder bath method  
Solution of rosin ethanol 25(mass)%  
80to 120℃、10s to 30s  
Sn-3.0Ag-0.5Cu(Lead Free Solder)  
245+/-5℃  
2+/-0.5s  
Measurement Temperature  
Shown in Rated value.  
DF0.1  
25℃  
10 Capacitance  
Measurement Frequency 1.0+/-0.1kHz  
Measurement Voltage  
1.0+/-0.2Vrms  
Measurement Temperature  
25℃  
11 Q or Dissipation Factor  
(D.F.)  
Measurement Frequency 1.0+/-0.1kHz  
Measurement Voltage  
1.0+/-0.2Vrms  
Measurement Temperature  
Measurement Voltage  
Charging Time  
More than 10000MΩ  
25℃  
Rated Voltage  
2min  
12 Insulation  
Resistance(I.R.)  
(Room Temperature)  
Charge/discharge current 50mA max.  
Measurement Temperature  
Measurement Voltage  
Charging Time  
More than 1000MΩ  
125℃  
Rated Voltage  
2min  
13 Insulation  
Resistance(I.R.)  
(High Temperature)  
Charge/discharge current 50mA max.  
No defects or abnormalities.  
Test Voltage  
Applied Time  
Charge/discharge current 50mA max.  
250% of the rated voltage  
1s to 5s  
14 Voltage proof  
15 Board Flex  
Appearance  
Capacitance Change  
Q or D.F.  
No defects or abnormalities.  
Within +/-10%  
Within the specified initial value.  
More than 10000MΩ  
Mounting method  
Pressurization Method  
Flexure  
Reflow solder the capacitor on the test substrate  
Shown in Fig.2  
1mm  
I.R.(Room Temp.)  
Holding Time  
60s  
Appearance  
Capacitance  
Q or D.F.  
No defects or abnormalities.  
Within the specified initial value.  
Within the specified initial value.  
More than 10000MΩ  
Mounting method  
Applied Force  
Holding Time  
Solder the capacitor on the test substrate  
2N  
60s  
16 Terminal Strength  
17 Beam Load Test  
I.R.(Room Temp.)  
Speed supplied the Stress Load  
Destruction Value: More than 8N  
0.5mm/s  
Placement diagram  
GCH155R72A222KE01-01B  
3

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