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GCG1554C1H2R0CA01# PDF预览

GCG1554C1H2R0CA01#

更新时间: 2023-09-03 20:31:17
品牌 Logo 应用领域
村田 - MURATA 医疗医疗器械
页数 文件大小 规格书
17页 692K
描述
汽车[动力总成 / 安全设备],汽车[信息娱乐 / 舒适设备],植入式以外的医疗器械设备 [GHTF A/B/C]

GCG1554C1H2R0CA01# 数据手册

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AEC-Q200 Murata Standard Specification and Test Methods  
Specification.  
No  
AEC-Q200 Test Item  
AEC-Q200 Test Method  
High Dielectric Type  
Temperature  
Compensating Type  
17 Beam Load Test  
Destruction value should be exceed following one.  
< Chip L dimension : 2.5mm max. >  
Place the capacitor in the beam load fixture as Fig 2.  
Apply a force.  
< Chip Length : 2.5mm max. >  
Chip thickness > 0.5mm rank : 20N  
Chip thickness 0.5mm rank : 8N  
< Chip L dimension : 3.2mm mim. >  
Iron Board  
Chip thickness < 1.25mm rank : 15N  
Chip thickness 1.25mm rank : 54.5N  
< Chip Length : 3.2mm min. >  
L
0.6L  
Fig.2  
Speed supplied the Stress Load : 0.5mm / sec.  
18 Capacitance  
Temperature  
Capacitance  
Change  
Within the specified tolerance.  
(Table A)  
R7 : Within ±15%  
(-55to +125)  
L8 : Within ±15%  
(-55to +125)  
ꢀꢀꢀWithin +15/-40%  
(+125to +150)  
R9 : Within ±15%  
(-55to +150)  
The capacitance change should be measured after 5 min. at  
each specified temperature stage.  
Characteristics  
(1)Temperature Compensating Type  
The temperature coefficient is determined using the capacitance  
measured in step 3 as a reference. When cycling the temperature  
sequentially from step1 through 5 (Δ C: +25to +125,  
5G:+25to +150other temp. coifficient.:+25to +85) the  
capacitance should be within the specified tolerance for the  
temperature coefficient and capacitance change as Table A-1. The  
capacitance drift is calculated by dividing the differences  
between the maximum and minimum measured values in the step  
1,3 and 5 by the cap value in step 3.  
Temperature  
Coefficient  
Within the specified tolerance.  
(Table A)  
Step  
1
Temp.()  
25±2  
2
3
-55±3  
25±2  
125±3(for 1C/2C/3C/4C/5C/R7)  
150±3(for 0C/5G/L8/R9)  
4
5
Within ±0.2% or ±0.05 pF  
Capacitance  
Drift  
25±2  
(Whichever is larger.)  
(2) High Dielectric Constant Type  
The ranges of capacitance change compared with the above 25℃  
value over the temperature ranges shown in the table should be  
within the specified ranges.  
Initial measurement for high dielectric constant type.  
Perform a heat treatment at 150+0/-10for one hour  
and then set for 24±2 hours at room temperature.  
Perform the initial measurement.  
Table A  
Capacitance Change from 20(%)  
Nominal Values  
(ppm/)*1  
Char.  
-55  
-25  
-10  
Max.  
0.54  
0.82  
1.37  
2.56  
Min.  
-0.23  
-0.45  
-0.90  
-1.88  
Max.  
0.33  
0.49  
0.82  
1.54  
Min.  
-0.14  
-0.27  
-0.54  
-1.13  
Max.  
0.22  
0.33  
0.55  
1.02  
Min.  
-0.09  
-0.18  
-0.36  
-0.75  
1C  
0C/2C  
3C  
0±30  
0±60  
0±120  
0±250  
4C  
*1 Nominal values denote the temperature coefficient with a range of 20to 125.  
(0C: temperature coefficient with a range of 20to 150.)  
Capacitance Change from 25C (%)  
-30  
Nominal Values  
(ppm/C) *2  
Char.  
-55  
-10  
Max.  
0.58  
Min.  
-0.24  
Max.  
0.40  
Min.  
-0.17  
Max.  
0.25  
Min.  
-0.11  
5C/5G  
0± 30  
*2:Nominalvaluesdenotethetemperaturecoefficient withinarangeof25Cto125C(forC)/150C(for5G).  
JEMCGS-03866  
5

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