■AEC-Q200 Murata Standard Specification and Test Methods
Specification.
No
AEC-Q200 Test Item
AEC-Q200 Test Method
High Dielectric Type
Temperature
Compensating Type
Pre-and Post-Stress
Electrical Test
1
2
-
High Temperature
Exposure (Storage)
The measured and observed characteristics should satisfy the
specifications in the following table.
Fix the capacitor to the supporting jig in the same manner and
under the same conditions as No.16.
Appearance No marking defects
Capacitance Within ±2.5% or ±0.25pF
Set the capacitor for 1000±12 hours at 150±3℃. Set for
24±2 hours at room temperature, then measure.
R7/L8/R9:Within ±12.5%
Change
Q/D.F.
(Whichever is larger)
30pFmin. : Q≧1000
R7/L8 : 0.05 max.
R9 : 0.075max.
30pFmax.: Q ≧400+20C
C: Nominal Capacitance(pF)
I.R.
More than 10,000MΩ or 500Ω・ F
R9 : More than 3,000MΩ or 150 Ω・ F
(Whichever is smaller)
3
Temperature Cycling
The measured and observed characteristics should satisfy the
specifications in the following table.
Fix the capacitor to the supporting jig in the same manner and
under the same conditions as No.16. Perform the 1000 cycles
according to the four heat treatments listed in the following table.
Set for 24±2 hours at room temperature, then measure
Appearance No marking defects
Capacitance Within ±2.5% or ±0.25pF
R7/L8/R9: Within ±10.0%
Change
Q/D.F.
(Whichever is larger)
Step
1
2
3
4
30pFmin.: Q ≧1000
R7/L8 W.V.: 25Vmin.: 0.03 max.
ꢀꢀꢀꢀꢀW.V.: 16V : 0.05 max
R9 : 0.075max.
125+3/-0
Temp.
Room
(for1C/2C/3C/4C/5C/R7)
150+3/-0
Room
30pFmax.: Q ≧ 400+20C
C: Nominal Capacitance (pF)
-55+0/-3
(℃)
Temp.
Temp.
(for 0C/5G/L8/R9)
I.R.
Time
More than 10,000MΩ or 500Ω ・F
15±3
1
15±3
1
(min.)
(Whichever is smaller)
・ Initial measurement for high dielectric constant type
Perform a heat treatment at 150+0/-10 ℃ for one hour and then set
for 24±2 hours at room temperature.
Perform the initial measurement.
4
5
Destructive
No defects or abnormalities
Per EIA-469.
Physical Analysis
Moisture Resistance
The measured and observed characteristics should satisfy the
specifications in the following table.
Fix the capacitor to the supporting jig in the same manner and
under the same conditions as No.16.
Apply the 24-hour heat (25 to 65℃) and humidity (80 to 98%)
treatment shown below, 10 consecutive times.
Set for 24±2 hours at room temperature, then measure.
Appearance No marking defects
Capacitance Within ±3.0% or ±0.30pF
Humidity
80～98%
Humidity
80～98%
R7/L8/R9: Within ±12.5%
R7/L8 : 0.05 max.
R9 : 0.075max.
Temperature
Humidity
90～98%
Humidity
90～98%
Humidity
90～98%
(℃)
Change
Q/D.F.
(Whichever is larger)
70
65
60
55
50
45
40
35
30
25
20
15
10
5
30pFmin. : Q≧350
10pF and over, 30pF and below:
Q≧275+5C/2
10pFmax.: Q ≧200+10C
C: Nominal Capacitance(pF)
I.R.
More than 10,000MΩ or 500Ω ・F
+10
2 ℃
-
R9 : More than 3,000MΩ or 150 Ω・ F
Initial measuremt
0
-5
(Whichever is smaller)
-10
One cycle 24hours
0
1
2
3
4
5
6
7
8
9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24
Hours
6
The measured and observed characteristics should satisfy the
specifications in the following table.
Biased Humidity
Fix the capacitor to the supporting jig in the same manner and
under the same conditions as No.16.
Apply the rated voltage and 1.3+0.2/-0vdc (add 6.8kΩ resister)
Appearance No marking defects
at 85±3℃ and 80 to 85% humidity for 1000±12 hours.
Remove and set for 24±2 hours at room temperature, then measure.
The charge/discharge current is less than 50mA.
Capacitance Within ±3.0% or ±0.30pF
R7/L8/R9: Within ±12.5%
Change
(Whichever is larger)
Q/D.F.
I.R.
30pF and over: Q≧200
R7/L8 : 0.05 max.
R9 : 0.075max.
30pF and below: Q≧100+10C/3
C: Nominal Capacitance(pF)
More than 1,000MΩ or 50Ω ・F
(Whichever is smaller)
JEMCGS-03866
2
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