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G3000TC600 PDF预览

G3000TC600

更新时间: 2024-02-11 03:11:18
品牌 Logo 应用领域
IXYS 栅极
页数 文件大小 规格书
14页 255K
描述
Gate Turn-Off SCR, 2300A I(T)RMS, 6000V V(DRM), 18V V(RRM), 1 Element,

G3000TC600 技术参数

是否无铅: 不含铅是否Rohs认证: 符合
生命周期:Obsolete包装说明:DISK BUTTON, O-CXDB-X4
Reach Compliance Code:unknownHTS代码:8541.30.00.80
风险等级:5.81配置:SINGLE
最大直流栅极触发电流:1000 mAJESD-30 代码:O-CXDB-X4
元件数量:1端子数量:4
封装主体材料:CERAMIC, METAL-SEALED COFIRED封装形状:ROUND
封装形式:DISK BUTTON峰值回流温度(摄氏度):NOT SPECIFIED
认证状态:Not Qualified最大均方根通态电流:2300 A
断态重复峰值电压:6000 V重复峰值反向电压:18 V
表面贴装:YES端子形式:UNSPECIFIED
端子位置:UNSPECIFIED处于峰值回流温度下的最长时间:NOT SPECIFIED
触发设备类型:GATE TURN-OFF SCRBase Number Matches:1

G3000TC600 数据手册

 浏览型号G3000TC600的Datasheet PDF文件第2页浏览型号G3000TC600的Datasheet PDF文件第3页浏览型号G3000TC600的Datasheet PDF文件第4页浏览型号G3000TC600的Datasheet PDF文件第6页浏览型号G3000TC600的Datasheet PDF文件第7页浏览型号G3000TC600的Datasheet PDF文件第8页 
WESTCODE An IXYS Company  
Anode Shorted Gate Turn-Off Thyristor type G3000TC600  
2 Characteristics  
2.1 Instantaneous on-state voltage  
Measured using a 500µs square pulse, see also the curves of figure 1 for other values of ITM.  
2.2 Latching and holding current  
These are considered to be approximately equal and only the latching current is measured, type test only  
as outlined below. The test circuit and wave diagrams are given in diagram 4. The anode current is  
monitored on an oscilloscope while VD is increased, until the current is seen to flow during the un-gated  
period between the end of IG and the application of reverse gate voltage. Test frequency is 100Hz with IGM  
& IG as for td of characteristic data.  
IG  
100µs  
IGM  
Gate current  
-16V  
100µs  
Anode current  
unlatched condition  
Unlatched  
Latched  
R1  
CT  
C1  
Anode current  
Latched condition  
Vs  
DUT  
Gate-drive  
Diagram 4, Latching test circuit and waveforms.  
2.3 Critical dv/dt  
The gate conditions are the same as for 1.1, this characteristic is for off-state only and does not relate to  
dv/dt at turn-off. The measurement, type test only, is conducted using the exponential ramp method as  
shown in diagram 5. It should be noted that GTO thyristors have a poor static dv/dt capability if the gate is  
open circuit or RGK is high impedance. Typical values: - dv/dt<100V/µs for RGK>10.  
Diagram 5, Definition of dV/dt.  
2.4 Off-state leakage.  
For IDRM & IRRM see notes 1.1 & 1.2 for gate leakage IGK, the off-state gate circuit is required to sink this  
leakage and still maintain minimum of –2 Volts. See diagram 6.  
Diagram 6.  
Data Sheet. Type G3000TC600 Issue 1  
Page 5 of 13  
September, 2004  

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