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FRX130D1 PDF预览

FRX130D1

更新时间: 2024-02-06 01:16:50
品牌 Logo 应用领域
飞兆/仙童 - FAIRCHILD 脉冲晶体管
页数 文件大小 规格书
6页 75K
描述
Power Field-Effect Transistor, 6A I(D), 100V, 0.18ohm, 1-Element, N-Channel, Silicon, Metal-oxide Semiconductor FET, CERAMIC, LCC-18

FRX130D1 技术参数

是否Rohs认证: 不符合生命周期:Transferred
零件包装代码:LCC包装说明:CHIP CARRIER, R-CQCC-N18
针数:18Reach Compliance Code:not_compliant
ECCN代码:EAR99风险等级:5.29
其他特性:RADIATION HARDENED外壳连接:DRAIN
配置:SINGLE WITH BUILT-IN DIODE最小漏源击穿电压:100 V
最大漏极电流 (Abs) (ID):6 A最大漏极电流 (ID):6 A
最大漏源导通电阻:0.18 ΩFET 技术:METAL-OXIDE SEMICONDUCTOR
JESD-30 代码:R-CQCC-N18JESD-609代码:e0
元件数量:1端子数量:18
工作模式:ENHANCEMENT MODE最高工作温度:150 °C
封装主体材料:CERAMIC, METAL-SEALED COFIRED封装形状:RECTANGULAR
封装形式:CHIP CARRIER极性/信道类型:N-CHANNEL
最大功率耗散 (Abs):11.4 W最大脉冲漏极电流 (IDM):18 A
认证状态:Not Qualified子类别:FET General Purpose Power
表面贴装:YES端子面层:Tin/Lead (Sn/Pb)
端子形式:NO LEAD端子位置:QUAD
晶体管应用:SWITCHING晶体管元件材料:SILICON
Base Number Matches:1

FRX130D1 数据手册

 浏览型号FRX130D1的Datasheet PDF文件第2页浏览型号FRX130D1的Datasheet PDF文件第3页浏览型号FRX130D1的Datasheet PDF文件第4页浏览型号FRX130D1的Datasheet PDF文件第5页浏览型号FRX130D1的Datasheet PDF文件第6页 
FRX130D, FRX130R,  
FRX130H  
Radiation Hardened  
N-Channel Power MOSFETs  
April 1998  
Features  
Description  
• 6A, 100V, r  
DS(ON)  
= 0.180Ω  
The Intersil has designed a series of SECOND GENERA-  
TION hardened power MOSFETs of both N-Channel and  
• Second Generation Rad Hard MOSFET Results From  
New Design Concepts  
P-Channel enhancement types with ratings from 100V to  
500V, 1A to 60A, and on resistance as low as 25m. Total  
dose hardness is offered at 100K RAD (Si) and 1000K RAD  
• Gamma  
2
(Si) with neutron hardness ranging from 1E13n/cm for  
- Meets Pre-RAD Specifications to 100K RAD (Si)  
2
500V product to 1E14n/cm for 100V product. Dose rate  
- Defined End-Point Specs at 300K RAD (Si) and  
1000K RAD (Si)  
hardness (GAMMA DOT) exists for rates to 1E9 without  
current limiting and 2E12 with current limiting.  
- Performance Permits Limited Use to 3000K RAD (Si)  
• Dose Rate  
This MOSFET is an enhancement-mode silicon-gate power  
field effect transistor of the vertical DMOS (VDMOS) struc-  
ture. It is specially designed and processed to exhibit mini-  
mal characteristic changes to total dose (GAMMA) and  
- Typically Survives 3E9 RAD (Si)/s at 80% BV  
DSS  
- Typically Survives 2E12 if Current Limited to I  
DM  
o
neutron (n ) exposures. Design and processing efforts are  
• Photo Current  
also directed to enhance survival to heavy ion (SEU) and/or  
dose rate (GAMMA DOT) exposure.  
- 1.50nA Per-RAD (Si)/s Typically  
• Neutron  
This part may be supplied as a die or in various packages  
other than shown above. Reliability screening is available  
as either non TX (commercial), TX equivalent of MIL-S-  
19500, TXV equivalent of MIL-S-19500, or space equiva-  
lent of MIL-S-19500. Contact the Intersil High-Reliability  
Marketing group for any desired deviations from the data  
sheet.  
- Maintain Pre-RAD Specifications  
2
for 3E13 Neutrons/cm  
2
- Usable to 3E14 Neutrons/cm  
Ordering Information  
PART NUMBER  
PACKAGE  
BRAND  
FRX130D1  
FRX130D1  
18 Ld CLCC  
Symbol  
FRX130D3  
18 Ld CLCC  
18 Ld CLCC  
18 Ld CLCC  
18 Ld CLCC  
18 Ld CLCC  
FRX130D3  
FRX130R1  
FRX130R3  
FRX130R4  
FRX130H4  
D
FRX130R1  
FRX130R3  
G
FRX130R4  
FRX130H4  
S
Package  
18 LEAD CLCC  
©2001 Fairchild Semiconductor Corporation  
FRX130D, FRX130R, FRX130H Rev. A  

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