Datasheet > FAR-C3SB-FREQ-M21-T

FAR-C3SB-FREQ-M21-T

更新时间： 2023-02-26 13:58:05

品牌	Logo	应用领域
富士通 - FUJITSU		/
页数	文件大小	规格书
11页	305K
描述
Series - Fundamental Quartz Crystal, 6MHz Min, 16MHz Max

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FAR-C3SB-FREQ-M21-T 数据手册

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FAR Family (C1, C3, C4 series)

■ APPLICATION EXAMPLES

•

C1 series

22 pF to 47 pF

680 Ω

1.8 kΩ

TTL oscillation circuit

(serial resonation circuit)

220 Ω

Output

R: Resonator

IC: MB74LS04

•

C3, C4 series

MB8850

MB8850H series

R: Resonator

■ RELIABILITY

Parameter

Test conditions

Requirements

Frequency fluctuation:

within ±0.1%

Shock

MIL-STD-883B, 2002, condtion C (3000G)

MIL-STD-202E, 201A (1.5 mm <0.059> at 10 Hz Frequency fluctuation:

Vibration

to 55 Hz for 2 hours)

within ±0.1%

5 times drop from 1 m (39.370 in.) height to

wooden board.

Frequency fluctuation:

within ±0.1%

Drop

Sealing

Immersion in water at 85°C

No bubbles observed

Frequency fluctuation:

within ±0.1%

Heat resistance

MIL-STD-202E, 210A condition B (260°C ^•5 sec.)

MIL-STD-883B, 1010, condition A (–35 to 85°C,

10 cycle)

Frequency fluctuation:

within ±0.1%

Temperature cycling

MIL-STD-883B, 1008, condition B 1000 h (100°C ^•Frequency fluctuation:

High-temperature loading test

High-temperature humidity test

1000 hours)

within ±0.1%

MIL-STD-202E, 103A, condition B (96 hours at

60°C, 90% to 95% RH, 12 VDC)

Frequency fluctuation:

within ±0.1%

1...7 8 91011

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