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ESD8708MUTAG PDF预览

ESD8708MUTAG

更新时间: 2024-02-23 16:12:36
品牌 Logo 应用领域
安森美 - ONSEMI /
页数 文件大小 规格书
10页 382K
描述
3.3 V, 8 Channel Unidirectional ESD Protection Array

ESD8708MUTAG 数据手册

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ESD8708  
ESD Protection Diode  
Low Capacitance Array for High Speed  
Data Lines  
The ESD8708 is designed specifically to protect four high speed  
differential pairs. Ultralow capacitance and low ESD clamping  
voltage make this device an ideal solution for protecting voltage  
sensitive high speed data lines. The flowthrough style package  
allows for easy PCB layout and matched trace lengths necessary to  
maintain consistent impedance for the high speed lines.  
www.onsemi.com  
MARKING  
DIAGRAM  
14  
1
8708M  
UDFN14  
CASE 517CN  
G
Features  
Integrated 4 Pairs (8 Lines) High Speed Data  
Single Connect, Flow through Routing  
Low Capacitance (0.5 pF Max, I/O to GND)  
8708  
M
= Specific Device Code  
= Date Code  
= PbFree Package  
G
Protection for the Following IEC Standards:  
IEC 6100042 Level 4 (ESD) 30 kV (Contact)  
IEC 6100045 (Lightning) 6.5 A (8/20 ms)  
These Devices are PbFree, Halogen Free/BFR Free and are RoHS  
ORDERING INFORMATION  
Compliant  
Device  
ESD8708MUTAG  
Package  
Shipping  
Typical Applications  
Gigabit Ethernet  
VbyOne HS  
LVDS  
UDFN14  
(PbFree)  
3000 / Tape &  
Reel  
†For information on tape and reel specifications,  
including part orientation and tape sizes, please  
refer to our Tape and Reel Packaging Specification  
Brochure, BRD8011/D.  
Display Port  
MAXIMUM RATINGS (T = 25°C unless otherwise noted)  
J
Rating  
Symbol  
Value  
55 to +125  
55 to +150  
260  
Unit  
°C  
Operating Junction Temperature Range  
Storage Temperature Range  
T
J
T
stg  
°C  
Lead Solder Temperature −  
Maximum (10 Seconds)  
T
L
°C  
IEC 6100042 Contact (ESD)  
IEC 6100042 Air (ESD)  
ESD  
ESD  
30  
30  
kV  
kV  
Maximum Peak Pulse Current  
I
PP  
6.5  
A
8/20 ms @ T = 25°C (I/OGND)  
A
Stresses exceeding those listed in the Maximum Ratings table may damage the  
device. If any of these limits are exceeded, device functionality should not be  
assumed, damage may occur and reliability may be affected.  
See Application Note AND8308/D for further description of  
survivability specs.  
© Semiconductor Components Industries, LLC, 2016  
1
Publication Order Number:  
June, 2019 Rev. 0  
ESD8708/D  

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