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ESD8551N2T5G PDF预览

ESD8551N2T5G

更新时间: 2023-09-03 20:29:43
品牌 Logo 应用领域
安森美 - ONSEMI 二极管
页数 文件大小 规格书
8页 503K
描述
低电容 ESD 保护二极管,用于高速数据线

ESD8551N2T5G 数据手册

 浏览型号ESD8551N2T5G的Datasheet PDF文件第2页浏览型号ESD8551N2T5G的Datasheet PDF文件第3页浏览型号ESD8551N2T5G的Datasheet PDF文件第4页浏览型号ESD8551N2T5G的Datasheet PDF文件第5页浏览型号ESD8551N2T5G的Datasheet PDF文件第6页浏览型号ESD8551N2T5G的Datasheet PDF文件第7页 
ESD Protection Diodes  
Low Capacitance ESD Protection Diode  
for High Speed Data Line  
ESD8551, SZESD8551  
The ESD8551 ESD protection diodes are designed to protect high  
speed data lines from ESD. Ultralow capacitance and low ESD  
clamping voltage make this device an ideal solution for protecting  
voltage sensitive high speed data lines.  
www.onsemi.com  
MARKING  
Features  
DIAGRAMS  
Low Capacitance (0.30 pF Max, I/O to GND)  
Protection for the Following IEC Standards:  
IEC 6100042 (Level 4) & ISO 10605  
X2DFN2  
CASE 714AB  
A M  
Low ESD Clamping Voltage  
SZESD8551MXWT5G Wettable Flank Package for Optimal  
Automated Optical Inspection (AOI)  
A
M
= Specific Device Code  
= Date Code  
SZ Prefix for Automotive and Other Applications Requiring Unique  
Site and Control Change Requirements; AECQ101 Qualified and  
PPAP Capable  
X2DFNW2  
CASE 711BG  
K M  
These Devices are PbFree, Halogen Free/BFR Free and are RoHS  
Compliant  
K
M
= Specific Device Code  
= Date Code  
Typical Applications  
USB 3.0  
MHL 2.0  
PIN CONFIGURATION  
AND SCHEMATIC  
eSATA  
MAXIMUM RATINGS (T = 25°C unless otherwise noted)  
J
1
2
Rating  
Symbol  
Value  
55 to +125  
55 to +150  
260  
Unit  
°C  
Operating Junction Temperature Range  
Storage Temperature Range  
T
J
T
stg  
°C  
=
Lead Solder Temperature −  
T
L
°C  
Maximum (10 Seconds)  
IEC 6100042 Contact  
IEC 6100042 Air  
ISO 10605 150 pF/2 kW  
ISO 10605 330 pF/2 kW  
ISO 10605 330 pF/330 W  
ESD  
20  
20  
30  
30  
15  
kV  
ORDERING INFORMATION  
See detailed ordering and shipping information in the package  
dimensions section on page 2 of this data sheet.  
Stresses exceeding those listed in the Maximum Ratings table may damage the  
device. If any of these limits are exceeded, device functionality should not be  
assumed, damage may occur and reliability may be affected.  
See Application Note AND8308/D for further description of  
survivability specs.  
© Semiconductor Components Industries, LLC, 2016  
1
Publication Order Number:  
July, 2021 Rev. 5  
ESD8551/D  

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