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DS34C87MWC PDF预览

DS34C87MWC

更新时间: 2024-11-19 13:07:27
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德州仪器 - TI 驱动器
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DS34C87MWC 数据手册

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DS34C87T  
www.ti.com  
SNLS376B MAY 1998REVISED APRIL 2013  
DS34C87T CMOS Quad TRI-STATE Differential Line Driver  
Check for Samples: DS34C87T  
1
FEATURES  
DESCRIPTION  
The DS34C87T is a quad differential line driver  
designed for digital data transmission over balanced  
lines. The DS34C87T meets all the requirements of  
EIA standard RS-422 while retaining the low power  
characteristics of CMOS. This enables the  
construction of serial and terminal interfaces while  
maintaining minimal power consumption.  
2
TTL Input Compatible  
Typical Propagation Delays: 6 ns  
Typical Output Skew: 0.5 ns  
Outputs Won't Load Line When VCC = 0V  
Meets the Requirements of EIA Standard RS-  
422  
The DS34C87T accepts TTL or CMOS input levels  
and translates these to RS-422 output levels. This  
part uses special output circuitry that enables the  
individual drivers to power down without loading down  
the bus. This device has separate enable circuitry for  
each pair of the four drivers. The DS34C87T is pin  
compatible to the DS3487T.  
Operation from Single 5V Supply  
TRI-STATE Outputs for Connection to System  
Buses  
Low Quiescent Current  
Available in Surface Mount  
All inputs are protected against damage due to  
electrostatic discharge by diodes to VCC and ground.  
Connection and Logic Diagrams  
Top View  
Figure 2. Logic Diagram  
See PIN DESCRIPTIONS for details.  
Figure 1. PDIP Package  
See Package Numbers D0016A or NFG0016E  
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of  
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
All trademarks are the property of their respective owners.  
2
PRODUCTION DATA information is current as of publication date.  
Products conform to specifications per the terms of the Texas  
Instruments standard warranty. Production processing does not  
necessarily include testing of all parameters.  
Copyright © 1998–2013, Texas Instruments Incorporated  

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