Datasheet > DAC6551AQDGKRQ1

DAC6551AQDGKRQ1

更新时间： 2023-09-03 20:32:40

品牌	Logo	应用领域
德州仪器 - TI		脉冲
页数	文件大小	规格书
29页	1392K
描述
DAC6551-Q1 汽车类 12 位、超低毛刺脉冲、电压输出 DAC \| DGK \| 8 \| -40 to 125

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DAC6551AQDGKRQ1 数据手册

DAC8551-Q1

www.ti.com.cn

ZHCSEV4A –FEBRUARY 2016–REVISED MARCH 2016

5 Pin Configuration and Functions

DGK Package

8-Pin VSSOP

Top View

GND

REF

SCLK

SYNC

OUT

Table 2. Pin Functions

NAME

TYPE

DESCRIPTION

NO.

Serial data input. Data is clocked into the 24-bit input shift register on each falling edge of the serial clock

input. Schmitt-trigger logic input.

D_IN

GND

GND Ground reference point for all circuitry on the device

SCLK

Serial clock input. Data can be transferred at rates up to 3 0MHz. Schmitt-trigger logic input.

Level-triggered control input (active-low). This is the frame synchronization signal for the input data. SYNC

going low enables the input shift register, and data is transferred in on the falling edges of the following

clocks. The DAC is updated following the 24th clock (unless SYNC is taken high before this edge, in which

case the rising edge of SYNC acts as an interrupt, and the write sequence is ignored by the DAC8551-Q1).

Schmitt-trigger logic input.

SYNC

V_DD

PWR Power supply input, 3.2 V to 5.5 V.

V_FB

Feedback connection for the output amplifier. For voltage output operation, tie to V_OUTexternally.

Analog output voltage from DAC. The output amplifier has rail-to-rail operation.

Reference voltage input.

V_OUT

V_REF

6 Specifications

6.1 Absolute Maximum Ratings

over operating ambient temperature range (unless otherwise noted)⁽¹⁾

MIN

–0.3

–65

MAX

UNIT

V_DDto GND

Digital input voltage to GND

V_OUTto GND

D_IN, SCLK and SYNC

V_DD+ 0.3

150

V_REFto GND

V_FBto GND

Junction temperature range, T_Jmax

Storage temperature, T_stg

°C

–65

150

(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings

only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended

Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.

1 234 5 6 7...29

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