CF5017 series
5V operation (CF5017ALA, ALB, ALC)
= 4.5 to 5.5V, V = 0V, Ta = −40 to +85°C unless otherwise noted.
V
DD
SS
Rating
Parameter
Symbol
Condition
Unit
min
3.9
typ
4.2
0.3
–
max
–
HIGH-level output voltage
LOW-level output voltage
HIGH-level input voltage
LOW-level input voltage
V
Q: Measurement cct 1, V = 4.5V, I = 16mA
DD OH
V
V
OH
V
Q: Measurement cct 2, V = 4.5V, I = 16mA
DD OL
–
0.4
–
OL
V
INHN
INHN
0.7V
V
IH
DD
V
–
–
–
–
0.3V
V
IL
DD
V
V
= V
= V
–
10
10
ꢀA
ꢀA
OH
DD
Output leakage current
I
Q: Measurement cct 2, INHN = LOW
Z
–
OL
SS
CF5017ALA
f = 40MHz
–
–
–
16
26
35
32
52
70
mA
mA
mA
Measurement cct 3, load cct 1,
INHN = open, C = 30pF
CF5017ALB
f = 60MHz
Current consumption
I
DD
L
CF5017ALC
f = 80MHz
Standby current
I
Measurement cct 3, INHN = LOW
Measurement cct 4
–
–
2
10
4
ꢀA
MΩ
kΩ
kΩ
kΩ
kΩ
kΩ
pF
ST
R
1
UP1
INHN pull-up resistance
R
20
100
3.5
3.5
3.5
–
200
4.03
4.03
4.03
150
11.5
9.2
UP2
CF5017ALA
CF5017ALB
CF5017ALC
2.97
2.97
2.97
50
Design value. A monitor pattern on a
wafer is tested.
AC feedback resistance
R
f1
DC feedback resistance
AC feedback capacitance
R
Measurement cct 5
f2
C
Design value. A monitor pattern on a wafer is tested.
Design value. A monitor pattern on a wafer is tested.
8.5
6.8
12.7
10
8
f
C
pF
G
Built-in capacitance
C
15
17.3
pF
D
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