CAT25C01, CAT25C02, CAT25C04
A.C. CHARACTERISTICS
SYMBOL PARAMETER
CAT25CXX-1.8
1.8V-5.5V
CAT25CXX
2.5V-5.5V 4.5V-5.5V
Test
Min.
50
Max. Min.
Max. Min. Max.
UNITS Conditions
tSU
tH
Data Setup Time
Data Hold Time
20
20
75
75
DC
20
20
40
40
ns
ns
50
tWH
tWL
fSCK
tLZ
SCK High Time
250
250
DC
ns
SCK Low Time
ns
Clock Frequency
HOLD to Output Low Z
Input Rise Time
1
50
2
5
50
2
DC
10
50
2
MHz
ns
(1)
tRI
µs
(1)
tFI
Input Fall Time
2
2
2
µs
tHD
tCD
HOLD Setup Time
HOLD Hold Time
Write Cycle Time
Output Valid from Clock Low
Output Hold Time
Output Disable Time
HOLD to Output High Z
CS High Time
100
100
40
40
40
40
ns
ns
(4)
CL = 50pF
(note 2)
tWC
tV
5
5
5
ms
ns
ns
ns
ns
ns
ns
ns
ns
ns
250
75
40
tHO
0
0
0
tDIS
tHZ
250
150
75
50
75
50
tCS
500
500
500
150
150
100
100
100
50
100
100
100
50
tCSS
tCSH
tWPS
tWPH
CS Setup Time
CS Hold Time
WP Setup Time
WP Hold Time
50
50
(1)(3)
Power-Up Timing
Symbol
tPUR
Parameter
Max.
Units
Power-up to Read Operation
Power-up to Write Operation
1
1
ms
ms
tPUW
NOTE:
(1) This parameter is tested initially and after a design or process change that affects the parameter.
(2) AC Test Conditions:
Input Pulse Voltages: 0.3V to 0.7V
CC
CC
Input rise and fall times: ≤10ns
Input and output reference voltages: 0.5V
CC
Output load: current source I max/I max; C =50pF
OL
OH
L
(3)
(4)
t
t
and t
are the delays required from the time V is stable until the specified operation can be initiated.
PUR
WC
PUW CC
is the time from the rising edge of CS after a valid write sequence to the end of the internal write cycle.
© 2005 by Catalyst Semiconductor, Inc.
Characteristics subject to change without notice
Doc. No. 1105, Rev. B
3