Datasheet > C2-1N0S-10_09

C2-1N0S-10_09

更新时间： 2022-10-18 18:58:51

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C2-1N0S-10_09 数据手册

CERAMIC CHIP INDUCTORS

C2 SERIES

6. RELIABILITY & TEST CONDITION :

ITEM

PERFORMANCE

TEST CONDITION

Low Temperature

Storage test

Appearance : No mechanical damage.

Temperature : -40±2°C

Duration : 1008±12hrs

Inductance : Within ±20% of initial value.

Measurement : After placing for 24 hours (min.) at room

ambient temperature

Thermal Shock

Vibration Test

Appearance : No mechanical damage.

Inductance : Within ±20% of initial value.

Temperature : -40°C, +85°C kept stabilized for

30 minutes each

Cycle : 100 cycles

Measurement : After placing for 24 hours (min.) at room

ambient temperature

Appearance : No mechanical damage.

Inductance : Within ±20% of initial value.

Waveform : Sine wave

Frequency : 10-55-10Hz for 1 min.

Amplitude : 1.5mm(peak-peak)

Directions & times : X, Y, Z directions for 2 hours.

A period of 2 hours in each of 3 mutually perpendicular

directions (Total 6 hours).

NOTE : Specifications subject to change without notice. Please check our website for latest information.

04.06.2009

SUPERWORLD ELECTRONICS (S) PTE LTD

PG. 5

1 2 3 456 7 8

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