Datasheet > BC239RLRE

BC239RLRE

更新时间： 2024-01-02 10:09:30

品牌	Logo	应用领域
安森美 - ONSEMI		放大器晶体管
页数	文件大小	规格书
34页	321K
描述
TRANSISTOR 100 mA, 25 V, NPN, Si, SMALL SIGNAL TRANSISTOR, TO-92, PLASTIC, TO-226AA, 3 PIN, BIP General Purpose Small Signal

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BC239RLRE 技术参数

生命周期：	Transferred	包装说明：	CYLINDRICAL, O-PBCY-T3
Reach Compliance Code：	unknown	ECCN代码：	EAR99
HTS代码：	8541.21.00.75	风险等级：	5.61
其他特性：	LOW NOISE	最大集电极电流 (IC)：	0.1 A
基于收集器的最大容量：	4.5 pF	集电极-发射极最大电压：	25 V
配置：	SINGLE	最小直流电流增益 (hFE)：	120
JEDEC-95代码：	TO-92	JESD-30 代码：	O-PBCY-T3
元件数量：	1	端子数量：	3
最高工作温度：	150 °C	封装主体材料：	PLASTIC/EPOXY
封装形状：	ROUND	封装形式：	CYLINDRICAL
极性/信道类型：	NPN	功耗环境最大值：	1 W
认证状态：	Not Qualified	表面贴装：	NO
端子形式：	THROUGH-HOLE	端子位置：	BOTTOM
晶体管应用：	AMPLIFIER	晶体管元件材料：	SILICON
标称过渡频率 (fT)：	280 MHz	VCEsat-Max：	0.6 V
Base Number Matches：	1

BC239RLRE 数据手册

154

153

UCL = 152.8

= 150.4

152

151

150

149

148

147

LCL = 148.0

UCL = 7.3

= 3.2

LCL = 0

Figure 4. Example of Process Control Chart Showing Oven Temperature Data

Where D4, D3, and A2 are constants varying by sample size,

with values for sample sizes from 2 to 10 shown in the

following partial table:

σ tot =

σ A + σ B + σ C + σ D + σ E

5 + 3 + 2 + 1 +(0.4) = 6.3

2.11

2.00 1.92 1.86 1.82 1.78

0.08 0.14 0.18 0.22

If only D is identified and eliminated, then:

σ tot =

3.27 2.57 2.28

5 + 3 + 2 + (0.4) = 6.2

This results in less than 2% total variability improvement. If

B, C, and D were eliminated, then:

1.88 1.02 0.73 0.58 0.48 0.42 0.37 0.34 0.31

*For sample sizes below 7, the LCL would technically be a negative number;

inthosecasesthereisnolowercontrollimit;thismeansthatforasubgroupsize

6, six ‘‘identical’’ measurements would not be unreasonable.

σ tot =

5 + (0.4) = 5.02

This gives a considerably better improvement of 23%. If

only A is identified and reduced from 5 to 2, then:

Control charts are used to monitor the variability of critical

process parameters. The R chart shows basic problems with

piece to piece variability related to the process. The X chart can

often identify changes in people, machines, methods, etc. The

source of the variability can be difficult to find and may require

experimental design techniques to identify assignable causes.

Some general rules have been established to help determine

when a process is OUT–OF–CONTROL. Figure 5 shows a

control chart subdivided into zones A, B, and C corresponding

to 3 sigma, 2 sigma, and 1 sigma limits respectively. In Figures

6 through 9 four of the tests that can be used to identify

excessive variability and the presence of assignable causes

are shown. As familiarity with a given process increases, more

subtle tests may be employed successfully.

Once the variability is identified, the cause of the variability

must be determined. Normally, only a few factors have a

significant impact on the total variability of the process. The

importance of correctly identifying these factors is stressed in

the following example. Suppose a process variability depends

on the variance of five factors A, B, C, D, and E. Each has a

variance of 5, 3, 2, 1, and 0.4, respectively.

σ tot =

2 + 3 + 2 + 1 + (0.4) = 4.3

Identifying and improving the variability from 5 to 2 yields a

total variability improvement of nearly 40%.

Most techniques may be employed to identify the primary

assignable cause(s). Out–of–control conditions may be

correlated to documented process changes. The product may

be analyzed in detail using best versus worst part comparisons

or Product Analysis Lab equipment. Multi–variance analysis

can be used to determine the family of variation (positional,

critical, or temporal). Lastly, experiments may be run to test

theoretical or factorial analysis. Whatever method is used,

assignable causes must be identified and eliminated in the

most expeditious manner possible.

After assignable causes have been eliminated, new control

limits are calculated to provide a more challenging variablility

criteria for the process. As yields and variability improve, it may

become more difficult to detect improvements because they

become much smaller. When all assignable causes have been

eliminated and the points remain within control limits for 25

groups, the process is said to in a state of control.

Since:

Motorola Small–Signal Transistors, FETs and Diodes Device Data

Reliability and Quality Assurance

9–19

1...28 29 303132 33 34

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与BC239RLRE相关器件

型号	品牌	获取价格	描述	数据表
BC239RLRF	MOTOROLA	获取价格	100mA, 25V, NPN, Si, SMALL SIGNAL TRANSISTOR, TO-92
BC239RLRM	MOTOROLA	获取价格	100mA, 25V, NPN, Si, SMALL SIGNAL TRANSISTOR, TO-92
BC239RLRM	ONSEMI	获取价格	100mA, 25V, NPN, Si, SMALL SIGNAL TRANSISTOR, TO-92, PLASTIC, TO-226AA, 3 PIN
BC239RLRP	MOTOROLA	获取价格	100mA, 25V, NPN, Si, SMALL SIGNAL TRANSISTOR, TO-92
BC239-TA	CJ	获取价格	TO-92 Plastic-Encapsulate Transistors
BC239ZL1	MOTOROLA	获取价格	Small Signal Bipolar Transistor, 0.1A I(C), 25V V(BR)CEO, 1-Element, NPN, Silicon, TO-92
BC239ZL1	ONSEMI	获取价格	100mA, 25V, NPN, Si, SMALL SIGNAL TRANSISTOR, TO-92, PLASTIC, TO-226AA, 3 PIN
BC23S03	AMPHENOL	获取价格	PCB Connector
BC-23S-03	AMPHENOL	获取价格	PCB CONNECTOR, ROHS COMPLIANT
BC-23S-03-1	AMPHENOL	获取价格	PCB Connector, ROHS COMPLIANT

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