Datasheet > B57860S0103J200

B57860S0103J200

更新时间： 2024-03-03 10:11:13

品牌	Logo	应用领域
东电化 - TDK		/
页数	文件大小	规格书
20页	548K
描述
Nominal Resistance=10kΩ

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中文翻译

获取价格

数据手册

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B57860S0103J200 数据手册

Temperature measurement and compensation

Leadless NTCs

B57860S

S860

8-inch frame

The 8-inch frame is loaded with chips,

arranged in 1 to 9 arrays, beginning with

array 1. Single chip positions can be

empty because some parts have been

removed for optical inspection or

electrical testing.

Dimensions in mm

Reliability data

Test

Standard

Test conditions

∆R₂₅/R₂₅

Remarks

(typical)

Storage in

dry heat

IEC

60068-2-2

Storage at upper

category temperature

T: 150 °C

< 3%

No visible

damage

t: 1000 h

Storage in damp

heat, steady state

IEC

Temperature of air: 85 °C

< 2%

No visible

damage

60068-2-78 Relative humidity of air: 85%

Duration: 1000 h

Rapid temperature IEC

Lower test temperature: ꢀ40 °C < 2%

No visible

damage

cycling

60068-2-14 Upper test temperature: 150 °C

Number of cycles: 100

Please read Cautions and warnings and

Important notes at the end of this document.

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