Datasheet > ATA6564-GAQW0

ATA6564-GAQW0

更新时间： 2022-06-24 15:40:00

品牌	Logo	应用领域
美国微芯 - MICROCHIP		/
页数	文件大小	规格书
28页	1239K
描述
High-Speed CAN Transceiver with Silent Mode - CAN FD Ready

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ATA6564-GAQW0 数据手册

ATA6564

2.0

ELECTRICAL CHARACTERISTICS

Absolute Maximum Ratings^(†)

DC Voltage at CANH and CANL ................................................................................................................ –27V to +42V

Transient Voltage on CANH and CANL (ISO 7637 part 2)..................................................................... –150V to +100V

Max. Differential Bus Voltage ....................................................................................................................... –5V to +18V

DC Voltage on all other Pins .................................................................................................................... –0.3V to +5.5V

ESD on CANH and CANL Pins (IEC 61000-4-2) .....................................................................................................±8 kV

ESD (HBM following STM 5.1 with 1.5 k/100 pF) (Pins CANH, CANL to GND)................................................... ±6 kV

Component Level ESD (HBM according to ANSI/ESD STM 5.1) JESD22-A114, AEC-Q 100 (002) ...................... ±4 kV

CDM ESD STM 5.3.1 ............................................................................................................................................. ±750V

ESD Machine Model AEC-Q100-RevF(003) .......................................................................................................... ±200V

Virtual Junction Temperature................................................................................................................. –40°C to +175°C

Storage Temperature..............................................................................................................................–55°C to +150°C

† Notice: Stresses beyond those listed below may cause permanent damage to the device. This is a stress rating only

and functional operation of the device at these or any other conditions beyond those indicated in the operational sec-

tions of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may

affect device reliability.

DS20005784D-page 8

 2017-2021 Microchip Technology Inc. and its subsidiaries

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