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AS29F040-120TC PDF预览

AS29F040-120TC

更新时间: 2024-02-02 03:23:51
品牌 Logo 应用领域
ALSC 可编程只读存储器电动程控只读存储器电可擦编程只读存储器
页数 文件大小 规格书
18页 325K
描述
5V 512K x 8 CMOS FLASH EEPROM

AS29F040-120TC 技术参数

是否Rohs认证: 不符合生命周期:Obsolete
零件包装代码:TSOP包装说明:TSOP1, TSSOP32,.8,20
针数:32Reach Compliance Code:unknown
ECCN代码:EAR99HTS代码:8542.32.00.51
风险等级:5.35最长访问时间:120 ns
其他特性:10K WRITE/ERASE CYCLE ENDURANCE命令用户界面:YES
数据轮询:YES耐久性:10000 Write/Erase Cycles
JESD-30 代码:R-PDSO-G32JESD-609代码:e0
长度:18.4 mm内存密度:4194304 bit
内存集成电路类型:FLASH内存宽度:8
功能数量:1部门数/规模:8
端子数量:32字数:524288 words
字数代码:512000工作模式:ASYNCHRONOUS
最高工作温度:85 °C最低工作温度:-40 °C
组织:512KX8输出特性:3-STATE
封装主体材料:PLASTIC/EPOXY封装代码:TSOP1
封装等效代码:TSSOP32,.8,20封装形状:RECTANGULAR
封装形式:SMALL OUTLINE, THIN PROFILE并行/串行:PARALLEL
电源:5 V编程电压:5 V
认证状态:Not Qualified座面最大高度:1.2 mm
部门规模:64K最大待机电流:0.0004 A
子类别:Flash Memories最大压摆率:0.06 mA
最大供电电压 (Vsup):5.5 V最小供电电压 (Vsup):4.5 V
标称供电电压 (Vsup):5 V表面贴装:YES
技术:CMOS温度等级:INDUSTRIAL
端子面层:Tin/Lead (Sn/Pb)端子形式:GULL WING
端子节距:0.5 mm端子位置:DUAL
切换位:YES类型:NOR TYPE
宽度:8 mmBase Number Matches:1

AS29F040-120TC 数据手册

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Only active during automated on-chip algorithms or sector erase time outs. DQ7 reflects complement  
of data last written when read during the automated on-chip algorithm (0 during erase algorithm);  
reflects true data when read after completion of an automated on-chip algorithm (1 after completion of  
erase agorithm).  
DATA polling  
(DQ7)  
Active during automated on-chip algorithms or sector time outs. DQ6 toggles when CE or OE toggles,  
or an Erase Resume command is invoked. When the automated on-chip algorithm is complete, DQ6  
stops toggling and valid data can be read. DQ6 is valid after the rising edge of the fourth pulse of WE  
during programming; after the rising edge of the sixth WE pulse during chip erase; after the last rising  
edge of the sector erase WE pulse for sector erase. For protected sectors, DQ6 toggles for <1 µs during  
writes, and <5 µs during erase (if all selected sectors are protected).  
Toggle bit 1 (DQ6)  
Indicates unsuccessful completion of program/ erase operation (DQ5 = 1). DATA polling remains  
active; CE powers the device down to 2 mA. If DQ5 = 1 during chip erase, all or some sectors are  
defective; during sector erase, the sector is defective (in this case, reset the device and execute  
a program or erase command sequence to continue working with functional sectors); during byte  
programming, that particular byte is defective. Attempting to program 0 to 1 will set DQ5 = 1.  
Exceeding time  
limit (DQ5)  
Checks whether sector erase timer window is open. If DQ3 = 1, erase is in progress; no commands will  
be accepted. If DQ3 = 0, the device will accept additional sector erase commands. Check DQ3 before  
and after each Sector Erase command to verify that the command was accepted.  
Sector erase timer  
(DQ3)  
During sector erase, DQ2 toggles with OE or CE only during an attempt to read a sector being erased.  
During chip erase, DQ2 toggles with OE or CE for all addresses. If DQ5 = 1, DQ2 toggles only at sector  
addresses where failure occurred, and will not toggle at other sector addresses. Use DQ2 in conjunction  
with DQ6 to determine whether device is in auto erase or erase suspend mode.  
Toggle bit 2 (DQ2)  
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Status  
DQ7  
DQ7  
0
DQ6  
DQ5  
DQ3  
DQ2  
Auto programming (byte)  
Program/ erase in auto erase  
Read erasing sector  
Toggle  
Toggle  
No toggle  
0
0
0
0
1
0
No toggle  
Toggle*  
Toggle  
1
In progress  
Erase  
suspend  
mode  
Read non-erasing  
sector  
Data  
DQ7  
Data  
Data  
0
Data  
0
Data  
Program in erase  
suspend  
Toggle  
Toggle*  
Auto programming (byte)  
Program/ erase in auto erase  
Program in erase suspend  
DQ7  
0
Toggle  
Toggle  
Toggle  
1
1
1
0
1
0
No toggle  
Toggle†  
No toggle†  
Exceeded time limits  
DQ7  
* Toggles with OE or CE only for erasing or erase suspended sector addresses.  
Toggles with OE or CE only for erasing or erase suspended sector addresses.  
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