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AM29DL642G90I PDF预览

AM29DL642G90I

更新时间: 2024-02-09 20:57:10
品牌 Logo 应用领域
超微 - AMD /
页数 文件大小 规格书
54页 832K
描述
128 Megabit (8 M x 16-Bit) CMOS 3.0 Volt-only Simultaneous Read/Write Flash Memo

AM29DL642G90I 技术参数

是否Rohs认证: 不符合生命周期:Obsolete
零件包装代码:BGA包装说明:10.95 X 11.95 MM, 0.80 MM PITCH, PLASTIC, FBGA-63
针数:63Reach Compliance Code:not_compliant
ECCN代码:3A991.B.1.AHTS代码:8542.32.00.51
风险等级:5.81最长访问时间:90 ns
启动块:BOTTOM/TOP命令用户界面:YES
通用闪存接口:YES数据轮询:YES
JESD-30 代码:R-PBGA-B63JESD-609代码:e0
长度:11.95 mm内存密度:134217728 bit
内存集成电路类型:FLASH MODULE内存宽度:16
湿度敏感等级:3功能数量:1
部门数/规模:16,126端子数量:63
字数:8388608 words字数代码:8000000
工作模式:ASYNCHRONOUS最高工作温度:85 °C
最低工作温度:-40 °C组织:8MX16
封装主体材料:PLASTIC/EPOXY封装代码:LFBGA
封装等效代码:BGA63,8X12,32封装形状:RECTANGULAR
封装形式:GRID ARRAY, LOW PROFILE, FINE PITCH并行/串行:PARALLEL
峰值回流温度(摄氏度):240电源:3/3.3 V
编程电压:3.3 V认证状态:Not Qualified
就绪/忙碌:YES座面最大高度:1.4 mm
部门规模:4K,32K最大待机电流:0.00001 A
子类别:Flash Memories最大压摆率:0.045 mA
最大供电电压 (Vsup):3.6 V最小供电电压 (Vsup):2.7 V
标称供电电压 (Vsup):3 V表面贴装:YES
技术:CMOS温度等级:INDUSTRIAL
端子面层:Tin/Lead (Sn/Pb)端子形式:BALL
端子节距:0.8 mm端子位置:BOTTOM
处于峰值回流温度下的最长时间:30切换位:YES
类型:NOR TYPE宽度:10.95 mm

AM29DL642G90I 数据手册

 浏览型号AM29DL642G90I的Datasheet PDF文件第48页浏览型号AM29DL642G90I的Datasheet PDF文件第49页浏览型号AM29DL642G90I的Datasheet PDF文件第50页浏览型号AM29DL642G90I的Datasheet PDF文件第51页浏览型号AM29DL642G90I的Datasheet PDF文件第53页浏览型号AM29DL642G90I的Datasheet PDF文件第54页 
P R E L I M I N A R Y  
ERASE AND PROGRAMMING PERFORMANCE  
Parameter  
Typ (Note 1) Max (Note 2)  
Unit  
sec  
sec  
µs  
Comments  
Sector Erase Time  
Chip Erase Time  
0.4  
56  
4
5
Excludes 00h programming  
prior to erasure (Note 4)  
Accelerated Word Program Time  
Word Program Time  
Chip Program Time (Note 3)  
Notes:  
120  
210  
84  
Excludes system level  
overhead (Note 5)  
7
µs  
28  
sec  
1. Typical program and erase times assume the following conditions: 25°C, 3.0 V VCC, 1,000,000 cycles. Additionally,  
programming typicals assume checkerboard pattern.  
2. Under worst case conditions of 90°C, VCC = 2.7 V, 1,000,000 cycles.  
3. The typical chip programming time is considerably less than the maximum chip programming time listed, since most bytes  
program faster than the maximum program times listed.  
4. In the pre-programming step of the Embedded Erase algorithm, all bytes are programmed to 00h before erasure.  
5. System-level overhead is the time required to execute the two- or four-bus-cycle sequence for the program command. See Table  
13 for further information on command definitions.  
6. The device has a minimum erase and program cycle endurance of 1,000,000 cycles.  
LATCHUP CHARACTERISTICS  
Description  
Min  
Max  
Input voltage with respect to VSS on all pins except I/O pins  
(including A9, OE#, and RESET#)  
–1.0 V  
12.5 V  
Input voltage with respect to VSS on all I/O pins  
VCC Current  
–1.0 V  
VCC + 1.0 V  
+100 mA  
–100 mA  
Note: Includes all pins except VCC. Test conditions: VCC = 3.0 V, one pin at a time.  
DATA RETENTION  
Parameter Description  
Test Conditions  
Min  
10  
Unit  
Years  
Years  
150°C  
125°C  
Minimum Pattern Data Retention Time  
20  
50  
Am29DL642G  
June 10, 2005  

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