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AM29DL164DT120EEN PDF预览

AM29DL164DT120EEN

更新时间: 2024-02-02 00:18:08
品牌 Logo 应用领域
其他 - ETC 闪存可编程只读存储器电动程控只读存储器电可擦编程只读存储器
页数 文件大小 规格书
52页 936K
描述
x8/x16 Flash EEPROM

AM29DL164DT120EEN 技术参数

是否Rohs认证:符合生命周期:Obsolete
零件包装代码:BGA包装说明:TFBGA,
针数:48Reach Compliance Code:compliant
ECCN代码:3A001.A.2.CHTS代码:8542.32.00.51
风险等级:5.23Is Samacsys:N
最长访问时间:120 ns其他特性:20 YEAR DATA RETENTION
备用内存宽度:8启动块:TOP
数据保留时间-最小值:20JESD-30 代码:R-PBGA-B48
JESD-609代码:e1长度:9 mm
内存密度:16777216 bit内存集成电路类型:FLASH
内存宽度:16湿度敏感等级:3
功能数量:1端子数量:48
字数:1048576 words字数代码:1000000
工作模式:ASYNCHRONOUS最高工作温度:125 °C
最低工作温度:-55 °C组织:1MX16
封装主体材料:PLASTIC/EPOXY封装代码:TFBGA
封装形状:RECTANGULAR封装形式:GRID ARRAY, THIN PROFILE, FINE PITCH
并行/串行:PARALLEL峰值回流温度(摄氏度):260
编程电压:3 V认证状态:Not Qualified
座面最大高度:1.2 mm最大供电电压 (Vsup):3.6 V
最小供电电压 (Vsup):2.7 V标称供电电压 (Vsup):3 V
表面贴装:YES技术:CMOS
温度等级:MILITARY端子面层:Tin/Silver/Copper (Sn/Ag/Cu)
端子形式:BALL端子节距:0.8 mm
端子位置:BOTTOM处于峰值回流温度下的最长时间:40
类型:NOR TYPE宽度:8 mm
Base Number Matches:1

AM29DL164DT120EEN 数据手册

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TABLE OF CONTENTS  
Chip Erase Command Sequence .................................................25  
Sector Erase Command Sequence .............................................. 25  
Erase Suspend/Erase Resume Commands ................................ 26  
Figure 4. Erase Operation .................................................................... 26  
Command Definitions ................................................................... 27  
Table 14. Am29DL162D/163D/164D Command Definitions ................. 27  
Write Operation Status . . . . . . . . . . . . . . . . . . . . 28  
DQ7: Data# Polling ......................................................................28  
Figure 5. Data# Polling Algorithm ......................................................... 28  
RY/BY#: Ready/Busy# ................................................................. 29  
DQ6: Toggle Bit I ..........................................................................29  
Figure 6. Toggle Bit Algorithm .............................................................. 29  
DQ2: Toggle Bit II .........................................................................30  
Reading Toggle Bits DQ6/DQ2 .................................................... 30  
DQ5: Exceeded Timing Limits ...................................................... 30  
DQ3: Sector Erase Timer .............................................................30  
Table 15. Write Operation Status ......................................................... 31  
Absolute Maximum Ratings . . . . . . . . . . . . . . . . 32  
Figure 7. Maximum Negative Overshoot Waveform............................. 32  
Figure 8. Maximum Positive Overshoot Waveform ............................. 32  
Product Selector Guide . . . . . . . . . . . . . . . . . . . . . 5  
Block Diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5  
Connection Diagrams . . . . . . . . . . . . . . . . . . . . . . . 6  
Special Handling Instructions for FBGA Package ..........................7  
Pin Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8  
Logic Symbol . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8  
Ordering Information . . . . . . . . . . . . . . . . . . . . . . . 9  
Device Bus Operations . . . . . . . . . . . . . . . . . . . . . 10  
Table 1. Am29DL162D/163D/164D Device Bus Operations .................10  
Word/Byte Configuration .............................................................. 10  
Requirements for Reading Array Data .........................................10  
Writing Commands/Command Sequences ..................................11  
Accelerated Program Operation ...............................................11  
Autoselect Functions .................................................................11  
Simultaneous Read/Write Operations with Zero Latency ............11  
Standby Mode .............................................................................. 11  
Automatic Sleep Mode .................................................................11  
RESET#: Hardware Reset Pin .....................................................12  
Output Disable Mode ...................................................................12  
Table 2. Am29DL162D/163D/164D Device Bank Divisions ..................12  
Table 3. Sector Addresses for Top Boot Sector Devices ......................13  
Table 4. SecSi Sector Addresses for Top Boot Devices .................. 13  
Table 5. Sector Addresses for Bottom Boot Sector Devices .................14  
Table 6. SecSi Addresses for Bottom Boot Devices ........................ 14  
Autoselect Mode .......................................................................... 15  
Table 7. Am29DL162D/163D/164D Autoselect Codes, (High  
Operating Ranges. . . . . . . . . . . . . . . . . . . . . . . . . 32  
DC Characteristics . . . . . . . . . . . . . . . . . . . . . . . . 33  
Figure 9. ICC1 Current vs. Time (Showing Active and Automatic  
Sleep Currents)..................................................................................... 34  
Figure 10. Typical ICC1 vs. Frequency................................................... 34  
Test Conditions . . . . . . . . . . . . . . . . . . . . . . . . . . 35  
Figure 11. Test Setup .......................................................................... 35  
Table 16. Test Specifications ................................................................ 35  
Key To Switching Waveforms ...................................................... 35  
Figure 12. Input Waveforms and Measurement Levels........................ 35  
AC Characteristics . . . . . . . . . . . . . . . . . . . . . . . . 36  
Voltage Method) ...................................................................................15  
Sector/Sector Block Protection and Unprotection ........................ 16  
Table 8. Top Boot Sector/Sector Block Addresses  
for Protection/Unprotection ...................................................................16  
Table 9. Bottom Boot Sector/Sector Block Addresses  
Read-Only Operations ........................................................... 36  
Figure 13. Read Operation Timings...................................................... 36  
for Protection/Unprotection ...................................................................16  
Write Protect (WP#) .....................................................................17  
Hardware Reset (RESET#) .................................................... 37  
Figure 14. Reset Timings...................................................................... 37  
Word/Byte Configuration (BYTE#) ...............................................38  
Figure 15. BYTE# Timings for Read Operations .................................. 38  
Figure 16. BYTE# Timings for Write Operations .................................. 38  
Erase and Program Operations ...................................................39  
Figure 17. Program Operation Timings ................................................ 40  
Figure 18. Accelerated Program Timing Diagram ................................ 40  
Figure 19. Chip/Sector Erase Operation Timings................................. 41  
Figure 20. Back-to-back Read/Write Cycle Timings ............................. 42  
Figure 21. Data# Polling Timings (During Embedded Algorithms) ....... 42  
Figure 22. Toggle Bit Timings (During Embedded Algorithms) ............ 43  
Figure 23. DQ2 vs. DQ6 ....................................................................... 43  
Temporary Sector/Sector Block Unprotect ...................................44  
Figure 24. Temporary Sector/Sector Block Unprotect Timing Diagram 44  
Figure 25. Sector/Sector Block Protect and Unprotect Timing Diagram 45  
Alternate CE# Controlled Erase and Program Operations ...........46  
Figure 26. Alternate CE# Controlled Write (Erase/Program)  
Temporary Sector/Sector Block Unprotect ...................................17  
Figure 1. Temporary Sector Unprotect Operation................................. 17  
Figure 2. In-System Sector/Sector Block Protection and  
Unprotection Algorithms........................................................................ 18  
SecSi (Secured Silicon) Sector Flash Memory Region ............19  
Factory Locked: SecSi Sector Programmed and Protected At the  
Factory ......................................................................................19  
Customer Lockable: SecSi Sector NOT Programmed or  
Protected At the Factory ...........................................................19  
Hardware Data Protection ............................................................19  
Low VCC Write Inhibit ...............................................................19  
Write Pulse “Glitch” Protection ..................................................20  
Logical Inhibit ............................................................................20  
Power-Up Write Inhibit ..............................................................20  
Common Flash Memory Interface (CFI) . . . . . . . 20  
Table 10. CFI Query Identification String.............................................. 20  
Table 11. System Interface String......................................................... 21  
Table 12. Device Geometry Definition .................................................. 21  
Table 13. Primary Vendor-Specific Extended Query ............................ 22  
Operation Timings ................................................................................ 47  
Erase And Programming Performance . . . . . . . 48  
Latchup Characteristics. . . . . . . . . . . . . . . . . . . . 48  
TSOP And SO Pin Capacitance . . . . . . . . . . . . . . 48  
Data Retention. . . . . . . . . . . . . . . . . . . . . . . . . . . . 48  
FBC048—48-Ball Fine-Pitch Ball Grid Array (FBGA)  
8 x 9 mm package ........................................................................49  
TS 048—48-Pin Standard TSOP .................................................50  
Revision Summary . . . . . . . . . . . . . . . . . . . . . . . . 51  
Revision A (September 1998) ...................................................... 51  
Command Definitions . . . . . . . . . . . . . . . . . . . . . . 23  
Reading Array Data ......................................................................23  
Reset Command ..........................................................................23  
Autoselect Command Sequence ..................................................23  
Enter SecSi Sector/Exit SecSi Sector Command Sequence ....24  
Byte/Word Program Command Sequence ...................................24  
Unlock Bypass Command Sequence .......................................24  
Figure 3. Program Operation ................................................................ 25  
Am29DL162D/163D/164D  
3

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