ADF4217L/ADF4218L/ADF4219L
BChips2
(Typical)
Parameter
B Version1
Unit
Test Conditions/Comments
NOISE CHARACTERISTICS6
RF Phase Noise Floor7
–171
–163
–167
–159
–171
–163
–167
–159
dBc/Hz typ
dBc/Hz typ
dBc/Hz typ
dBc/Hz typ
@ 30 kHz PFD Frequency
@ 200 kHz PFD Frequency
@ 30 kHz PFD Frequency
@ 200 kHz PFD Frequency
@ VCO Output
1.95 GHz Output; 30 kHz PFD
900 MHz Output; 200 kHz PFD
900 MHz Output; 30 kHz PFD
900 MHz Output; 200 kHz PFD
Measured at Offset of fPFD/2fPFD
IF Phase Noise Floor7
Phase Noise Performance8
RF9
–75
–90
–77
–86
–75
–90
–77
–86
dBc/Hz typ
dBc/Hz typ
dBc/Hz typ
dBc/Hz typ
RF10
IF11
IF12
Spurious Signals
RF9
RF10
IF11
IF12
–78/–85
–80/–84
–79/–86
–80/–84
–78/–85
–80/–84
–79/–86
–80/–84
dBc typ
dBc typ
dBc typ
dBc typ
NOTES
1Operating temperature range is as follows: B Version: –40°C to +85°C.
2The BChip specifications are given as typical values.
3This is the maximum operating frequency of the CMOS counters. The prescaler value should be chosen to ensure that the RF input is divided down to a frequency
that is less than this value.
4Guaranteed by design. Sample tested to ensure compliance.
5This includes relevant IP.
6VDD = 3 V; P = 16/32; IFIN /RFIN for ADF4218L, ADF4219L = 540 MHz/900 MHz.
7The synthesizer phase noise floor is estimated by measuring the in-band phase noise at the output of the VCO and subtracting 20logN (where N is the N divider value).
8The phase noise is measured with the EVAL-ADF421xEB1 Evaluation Board and the HP8562E Spectrum Analyzer. The spectrum analyzer provides the REFIN
for the synthesizer. (fREFOUT = 10 MHz @ 0 dBm.)
9fREFIN = 10 MHz; fPFD = 30 kHz; Offset frequency = 1 kHz; fRF = 1.95 GHz; N = 65000; Loop B/W = 3 kHz
10
11
12
f
f
f
= 10 MHz; fPFD = 200 kHz; Offset frequency = 1 kHz; fRF = 900 MHz; N = 4500; Loop B/W = 20 kHz
= 10 MHz; fPFD = 30 kHz; Offset frequency = 1 kHz; fIF = 900 MHz; N = 30000; Loop B/W = 3 kHz
= 10 MHz; fPFD = 200 kHz; Offset frequency = 1 kHz; fIF = 900 MHz; N = 4500; Loop B/W = 20 kHz
REFIN
REFIN
REFIN
Specifications subject to change without notice.
(VDD1 = VDD2 = 3 V ؎ 10%, 5 V ؎ 10%; VDD1, VDD2 ≤ VP1,
TIMING CHARACTERISTICS
VP2 ≤ 6.0 V ; AGNDRF1 = DGNDRF1 = AGNDRF2 = DGNDRF2 = 0 V; TA = TMIN to TMAX, unless otherwise noted.)
Limit at
TMIN to TMAX
(B Version)
Parameter
Unit
Test Conditions/Comments
t1
t2
t3
t4
t5
t6
10
10
25
25
10
50
ns min
ns min
ns min
ns min
ns min
ns min
DATA to CLOCK Setup Time
DATA to CLOCK Hold Time
CLOCK High Duration
CLOCK Low Duration
CLOCK to LE Setup Time
LE Pulsewidth
Guaranteed by design but not production tested.
t3
t4
CLOCK
t1
t2
DB1
(CONTROL BIT C2)
DB0 (LSB)
(CONTROL BIT C1)
DATA
LE
DB21 (MSB)
DB20
DB2
t6
t5
LE
Figure 1. Timing Diagram
–3–
REV. C