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ADC3543 PDF预览

ADC3543

更新时间: 2023-09-03 20:27:37
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德州仪器 - TI /
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描述
单通道、14 位、65MSPS、低噪声、超低功耗和低延迟 ADC

ADC3543 数据手册

 浏览型号ADC3543的Datasheet PDF文件第2页浏览型号ADC3543的Datasheet PDF文件第3页浏览型号ADC3543的Datasheet PDF文件第4页浏览型号ADC3543的Datasheet PDF文件第6页浏览型号ADC3543的Datasheet PDF文件第7页浏览型号ADC3543的Datasheet PDF文件第8页 
ADC3541, ADC3542, ADC3543  
ZHCSLJ1C JULY 2020 REVISED DECEMBER 2022  
www.ti.com.cn  
6 Specifications  
6.1 Absolute Maximum Ratings  
over operating free-air temperature range (unless otherwise noted)(1)  
PARAMETER  
TEST CONDITIONS  
MIN  
0.3  
0.3  
0.3  
0.3  
0.3  
MAX UNIT  
Supply voltage range, AVDD, IOVDD  
2.1  
0.3  
V
V
Supply voltage range, GND, IOGND, REFGND  
AINP/M, CLKP/M, VREF, REFBUF  
Voltage applied  
to input pins  
D3 (DCLKIN)  
Junction temperature, TJ  
MIN(2.1, AVDD+0.3)  
MIN(2.1, AVDD+0.3)  
MIN(2.1, IOVDD+0.3)  
105  
V
PDN, RESET, SCLK, SEN, SDIO  
V
°C  
°C  
Storage temperature, Tstg  
150  
65  
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings  
only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under  
Recommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device  
reliability.  
6.2 ESD Ratings  
VALUE  
2500  
UNIT  
Human body model (HBM), per ANSI/ESDA/JEDEC JS-001, all pins(1)  
Charged device model (CDM), per ANSI/ESDA/JEDEC JS-002, all pins(2)  
V(ESD)  
Electrostatic discharge  
V
1000  
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.  
(2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.  
6.3 Recommended Operating Conditions  
over operating free-air temperature range (unless otherwise noted)  
MIN  
1.75  
1.75  
40  
NOM  
1.8  
MAX  
1.85  
UNIT  
AVDD(1)  
V
V
Supply  
voltage range  
IOVDD(1)  
1.8  
1.85  
TA  
TJ  
Operating free-air temperature  
Operating junction temperature  
105  
°C  
°C  
105(2)  
(1) Measured to GND.  
(2) Prolonged use above this junction temperature may increase the device failure-in-time (FIT) rate.  
6.4 Thermal Information  
ADC354x  
THERMAL METRIC(1)  
RSB (QFN)  
40 Pins  
30.7  
UNIT  
RΘJA  
Junction-to-ambient thermal resistance  
Junction-to-case (top) thermal resistance  
Junction-to-board thermal resistance  
°C/W  
°C/W  
°C/W  
°C/W  
°C/W  
°C/W  
RΘJC(top)  
RΘJB  
16.4  
10.5  
Junction-to-top characterization parameter  
Junction-to-board characterization parameter  
Junction-to-case (bottom) thermal resistance  
0.2  
ΨJT  
10.5  
ΨJB  
RΘJC(bot)  
2.0  
(1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application  
report, SPRA953.  
Copyright © 2023 Texas Instruments Incorporated  
Submit Document Feedback  
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Product Folder Links: ADC3541 ADC3542 ADC3543  
 
 
 
 
 
 
 
 
 
 
 

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