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ADC08831IWM/NOPB

更新时间： 2024-02-26 07:40:08
品牌 Logo 应用领域
德州仪器 - TI 光电二极管转换器
页数 文件大小 规格书
31页 1528K
描述
1-CH 8-BIT SUCCESSIVE APPROXIMATION ADC, SERIAL ACCESS, PDSO14, SOIC-14

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ADC08831IWM/NOPB 技术参数

是否无铅： 不含铅是否Rohs认证： 符合
生命周期：Obsolete零件包装代码：SOIC
包装说明：SOP, SOP14,.4针数：14
Reach Compliance Code：compliantECCN代码：EAR99
HTS代码：8542.39.00.01风险等级：5.63
最大模拟输入电压：5.05 V最小模拟输入电压：-0.05 V
最长转换时间：4 µs转换器类型：ADC, SUCCESSIVE APPROXIMATION
JESD-30 代码：R-PDSO-G14JESD-609代码：e3
长度：9 mm湿度敏感等级：3
模拟输入通道数量：1位数：8
功能数量：1端子数量：14
最高工作温度：85 °C最低工作温度：-40 °C
输出位码：BINARY输出格式：SERIAL
封装主体材料：PLASTIC/EPOXY封装代码：SOP
封装等效代码：SOP14,.4封装形状：RECTANGULAR
封装形式：SMALL OUTLINE峰值回流温度（摄氏度）：260
电源：5 V认证状态：Not Qualified
采样速率：0.181 MHz采样并保持/跟踪并保持：TRACK
座面最大高度：2.65 mm子类别：Analog to Digital Converters
标称供电电压：5 V表面贴装：YES
技术：CMOS温度等级：INDUSTRIAL
端子面层：Matte Tin (Sn)端子形式：GULL WING
端子节距：1.27 mm端子位置：DUAL
处于峰值回流温度下的最长时间：40宽度：7.5 mm
Base Number Matches：1

ADC08831IWM/NOPB 数据手册

 浏览型号ADC08831IWM/NOPB的Datasheet PDF文件第1页浏览型号ADC08831IWM/NOPB的Datasheet PDF文件第2页浏览型号ADC08831IWM/NOPB的Datasheet PDF文件第4页浏览型号ADC08831IWM/NOPB的Datasheet PDF文件第5页浏览型号ADC08831IWM/NOPB的Datasheet PDF文件第6页浏览型号ADC08831IWM/NOPB的Datasheet PDF文件第7页 
ADC08831, ADC08832  
www.ti.com  
SNAS015C –SEPTEMBER 1999–REVISED MARCH 2013  
Electrical Characteristics  
The following specifications apply for VCC = VREF = +5VDC, and fCLK = 2 MHz unless otherwise specified. Boldface limits  
apply for TA = TJ = TMIN to TMAX; all other limits TA = TJ = 25°C.  
Symbol  
Parameter  
Conditions  
Typical(1)  
Limits(2)  
Units (Limits)  
CONVERTER AND MULTIPLEXER CHARACTERISTICS  
TUE  
Total Unadjusted Error  
See(3)  
±0.3  
±1  
LSB  
(max)  
Offset Error  
±0.2  
±0.2  
±0.2  
±0.3  
3.5  
LSB  
LSB  
LSB  
LSB  
DNL  
INL  
Differential NonLinearity  
Integral NonLinearity  
Full Scale Error  
FS  
RREF  
Reference Input Resistance  
See(4)  
See(5)  
2.8  
5.9  
kΩ (min)  
kΩ (max)  
VIN  
Analog Input Voltage  
(VCC + 0.05)  
(GND − 0.05)  
V (max)  
V (min)  
DC Common-Mode Error  
Power Supply Sensitivity  
±¼  
LSB (max)  
VCC = 5V ±10%,  
VCC = 5V ±5%  
±¼  
±¼  
LSB (max)  
LSB (max)  
On Channel Leakage Current(6)  
On Channel = 5V,  
Off Channel = 0V  
0.2  
1
μA (max)  
μA (min)  
μA (min)  
μA (max)  
On Channel = 0V  
Off Channel = 5V  
−0.2  
−1  
Off Channel Leakage Current(7)  
On Channel = 5V, Off  
Channel = 0V  
−0.2  
−1  
On Channel = 0V,  
Off Channel = 5V  
0.2  
1
DC CHARACTERISTICS  
VIN(1)  
VIN(0)  
IIN(1)  
Logical “1” Input Voltage  
2.0  
0.8  
+1  
V (min)  
V (max)  
μA (max)  
μA (max)  
Logical “0” Input Voltage  
Logical “1” Input Current  
Logical “0” Input Current  
Logical “1” Output Voltage  
VIN = 5.0V  
0.05  
0.05  
IIN(0)  
VIN = 0V  
−1  
VOUT(1)  
VCC = 4.75V:  
IOUT = −360 μA  
IOUT = −10 μA  
2.4  
4.5  
0.4  
V (min)  
V (min)  
V (max)  
VOUT(0)  
Logical “0” Output Voltage  
VCC = 4.75V  
IOUT = 1.6 mA  
(1) Typicals are at TJ = 25°C and represent the most likely parametric norm.  
(2) Specified to TI's AOQL (Average Outgoing Quality Level).  
(3) Total Unadjusted Error (TUE) includes offset, full-scale, linearity, multiplexer errors.  
(4) It is not tested for the ADC08832.  
(5) For VIN(−) ≥ VIN(+) the digital code will be 0000 0000. Two on-chip diodes are tied to each analog input (see ADC08832 Functional Block  
Diagram) which will forward-conduct for analog input voltages one diode drop below ground or one diode drop greater than VCC supply.  
During testing at low VCC levels (e.g., 4.5V), high level analog inputs (e.g., 5V) can cause an input diode to conduct, especially at  
elevated temperatures, which will cause errors for analog inputs near full-scale. The spec allows 50 mV forward bias of either diode; this  
means that as long as the analog VIN does not exceed the supply voltage by more than 50 mV, the output code will be correct.  
Exceeding this range on an unselected channel will corrupt the reading of a selected channel. Achievement of an absolute 0 VDC to 5  
VDC input voltage range will therefore require a minimum supply voltage of 4.950 VDC over temperature variations, initial tolerance and  
loading.  
(6) Channel leakage current is measured after a single-ended channel is selected and the clock is turned off. For off channel leakage  
current the following two cases are considered: one, with the selected channel tied high (5 VDC) and the remaining off channel tied low  
(0 VDC), total current flow through the off channel is measured; two, with the selected channel tied low and the off channels tied high,  
total current flow through the off channel is again measured. The two cases considered for determining on channel leakage current are  
the same except total current flow through the selected channel is measured.  
(7) Channel leakage current is measured after a single-ended channel is selected and the clock is turned off. For off channel leakage  
current the following two cases are considered: one, with the selected channel tied high (5 VDC) and the remaining off channel tied low  
(0 VDC), total current flow through the off channel is measured; two, with the selected channel tied low and the off channels tied high,  
total current flow through the off channel is again measured. The two cases considered for determining on channel leakage current are  
the same except total current flow through the selected channel is measured.  
Copyright © 1999–2013, Texas Instruments Incorporated  
Submit Documentation Feedback  
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Product Folder Links: ADC08831 ADC08832  
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