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AD8410A

更新时间： 2023-12-20 18:44:51

品牌	Logo	应用领域
亚德诺 - ADI		/
页数	文件大小	规格书
25页	1612K
描述
?2 V to 70 V Wide Input Voltage Range, 2.2 MHz High Bandwidth, Current-Sense Amplifier with PWM Rejection

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Data Sheet

AD8410A

OFFSET VOLTAGE TERMINOLOGY

BOX METHOD

BOWTIE METHOD

The AD8410A features an in-package trim core, which leads to a

typical offset drift of ±0.21 μV/°C (using the Box Method) throughout

the operating temperature range and the common-mode voltage

range. This architecture does not compromise bandwidth, but the

offset voltage drift signatures for the AD8410A vary part to part as

shown in the Figure 55. After observing the minimum and maximum

value for V_OSover the full temperature range from −40°C to 125°C,

the V_OSin μV/°C is calculated for each part using the box method.

Typically, in the applications where the AD8410A is used, a calibra-

tion is done at 25°C. If a single point calibration at 25°C is done on

the 120 parts as shown in Figure 55, this creates a plot shown in

Figure 57. For each part, the slope of the line from 25°C to −40°C

is calculated and the slope from 25°C to 125°C for each part is

calculated. The mean and standard deviation for the slope of all

the parts from 25°C to −40°C is then calculated. The V_OSmax drift

of ±1.85 μV/°C using the bowtie method is then calculated using

Equation 2. The mean and standard deviation for the slope of all

the parts from 25°C to 125°C is then calculated. The V_OSmax drift

of 1.51 μV/°C using the bowtie method is then calculated using

Equation 2. The red lines in Figure 57 represent the worst-case

V_OSdrift slopes using the bowtie method that a user can guarantee

through characterization. Calibrating at 25°C allows the max V_OS

over the full temp range to be reduced to ~±151 μV, as opposed

to the ±200 μV listed in the Specifications section as the max V_OS

over temperature (with no calibration).

Figure 55. Offset Voltage vs. Temperature

A visual representation of this box method calculation and the mean

value for the V_OSdrift using the box method is shown in Figure 56.

Based on the mean (Typ) value of ±0.21 μV/°C and the standard

deviation of the box method drift of the 120 parts from Figure 55,

a user can calculate a value (see Equation 2) for a guarantee V_OS

drift by characterization, ±0.71 μV/°C.

(2)

± MEAN + 5 × STANDARD DEVIATION

Figure 57. Bowtie Method

This is valid from −40°C to 125°C temperature range.

Figure 56. Box Method

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