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AD7841ASZ-REEL PDF预览

AD7841ASZ-REEL

更新时间: 2024-01-24 16:41:28
品牌 Logo 应用领域
亚德诺 - ADI /
页数 文件大小 规格书
13页 442K
描述
Octal 14-Bit, Parallel Input, Voltage-Output DAC

AD7841ASZ-REEL 技术参数

是否无铅:不含铅是否Rohs认证:符合
生命周期:Obsolete零件包装代码:QFP
包装说明:ROHS COMPLIANT, MO-112AA-1, MQFP-44针数:44
Reach Compliance Code:unknownECCN代码:EAR99
HTS代码:8542.39.00.01风险等级:5.39
Is Samacsys:N最大模拟输出电压:10 V
最小模拟输出电压:-10 V转换器类型:D/A CONVERTER
输入位码:BINARY输入格式:PARALLEL, WORD
JESD-30 代码:S-PQFP-G44JESD-609代码:e3
长度:10 mm最大线性误差 (EL):0.0122%
湿度敏感等级:3标称负供电电压:-15 V
位数:14功能数量:1
端子数量:44最高工作温度:85 °C
最低工作温度:-40 °C封装主体材料:PLASTIC/EPOXY
封装代码:QFP封装等效代码:QFP44,.57SQ,32
封装形状:SQUARE封装形式:FLATPACK
峰值回流温度(摄氏度):260电源:5,+-15 V
认证状态:Not Qualified座面最大高度:2.45 mm
标称安定时间 (tstl):31 µs子类别:Other Converters
最大压摆率:14 mA标称供电电压:15 V
表面贴装:YES技术:CMOS
温度等级:INDUSTRIAL端子面层:Matte Tin (Sn)
端子形式:GULL WING端子节距:0.8 mm
端子位置:QUAD处于峰值回流温度下的最长时间:40
宽度:10 mmBase Number Matches:1

AD7841ASZ-REEL 数据手册

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AD7841  
TERMINOLOGY  
DC Output Impedance  
Relative Accuracy  
This is the effective output source resistance. It is dominated by  
package lead resistance.  
Relative accuracy or endpoint linearity is a measure of the max-  
imum deviation from a straight line passing through the endpoints  
of the DAC transfer function. It is measured after adjusting for  
zero-scale error and full-scale error and is expressed in Least  
Significant Bits.  
Full-Scale Error  
This is the error in DAC output voltage when all 1s are loaded  
into the DAC latch. Ideally the output voltage, with all 1s loaded  
into the DAC latch, should be 2 VREF(+) – 1 LSB.  
Differential Nonlinearity  
Zero-Scale Error  
Differential nonlinearity is the difference between the measured  
change and the ideal 1 LSB change between any two adjacent  
codes. A specified differential nonlinearity of 1 LSB maximum  
ensures monotonicity.  
Zero-scale error is the error in the DAC output voltage when all  
0s are loaded into the DAC latch. Ideally the output voltage,  
with all 0s in the DAC latch should be equal to 2 VREF(–). Zero-  
scale error is mainly due to offsets in the output amplifier.  
DC Crosstalk  
Gain Error  
Although the common input reference voltage signals are inter-  
nally buffered, small IR drops in the individual DAC reference  
inputs across the die can mean that an update to one channel  
can produce a dc output change in one or another of the chan-  
nel outputs.  
Gain Error is defined as (Full-Scale Error) – (Zero-Scale Error).  
GENERAL DESCRIPTION  
DAC Architecture—General  
Each channel consists of a straight 14-bit R-2R voltage-mode  
DAC. The full-scale output voltage range is equal to twice the  
reference span of VREF(+) – VREF(–). The DAC coding is straight  
binary; all 0s produces an output of 2 VREF(–); all 1s produces  
an output of 2 VREF(+) – 1 LSB.  
The eight DAC outputs are buffered by op amps that share  
common VDD and VSS power supplies. If the dc load current  
changes in one channel (due to an update), this can result in a  
further dc change in one or another of the channel outputs. This  
effect is most obvious at high load currents and reduces as the  
load currents are reduced. With high impedance loads the effect  
is virtually impossible to measure.  
The analog output voltage of each DAC channel reflects the  
contents of its own DAC register. Data is transferred from  
the external bus to the input register of each DAC on a per  
channel basis.  
Output Voltage Settling Time  
This is the amount of time it takes for the output to settle to a  
specified level for a full-scale input change.  
Bringing the CLR line low switches all the signal outputs, VOUTA  
to VOUTH, to the voltage level on the relevant DUTGND pin.  
When the CLR signal is brought back high, the output voltages  
from the DACs will reflect the data stored in the relevant  
DAC registers.  
Digital-to-Analog Glitch Impulse  
This is the amount of charge injected into the analog output  
when the inputs change state. It is specified as the area of the  
glitch in nV-secs. It is measured with VREF(+) = +5 V and  
Data Loading to the AD7841  
Data is loaded into the AD7841 in straight parallel 14-bit wide  
words.  
V
REF(–) = –5 V and the digital inputs toggled between 1FFFH  
and 2000H.  
Channel-to-Channel Isolation  
The DAC output voltages, VOUTA – VOUTH are updated to  
reflect new data in the DAC registers.  
Channel-to-channel isolation refers to the proportion of input  
signal from one DAC’s reference input that appears at the out-  
put of another DAC. It is expressed in dBs.  
The actual input register being written to is determined by the  
logic levels present on the device’s address lines, as shown in  
Table I.  
DAC-to-DAC Crosstalk  
DAC-to-DAC crosstalk is defined as the glitch impulse that  
appears at the output of one converter due to both the digital  
change and subsequent analog O/P change at another converter.  
It is specified in nV-secs.  
Table I. Address Line Truth Table  
A2  
A1  
A0  
DAC Selected  
Digital Crosstalk  
0
0
0
0
1
1
1
1
0
0
1
1
0
0
1
1
0
1
0
1
0
1
0
1
INPUT REG A (DAC A)  
INPUT REG B (DAC B)  
INPUT REG C (DAC C)  
INPUT REG D (DAC D)  
INPUT REG E (DAC E)  
INPUT REG F (DAC F)  
INPUT REG G (DAC G)  
INPUT REG H (DAC H)  
The glitch impulse transferred to the output of one converter  
due to a change in digital input code to the other converter is  
defined as the digital crosstalk and is specified in nV-secs.  
Digital Feedthrough  
When the device is not selected, high frequency logic activity on  
the device’s digital inputs can be capacitively coupled both  
across and through the device to show up as noise on the VOUT  
pins. This noise is digital feedthrough.  
REV. B  
–6–  

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