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AD783AQ

更新时间: 2024-01-26 17:41:16
品牌 Logo 应用领域
亚德诺 - ADI 放大器
页数 文件大小 规格书
8页 134K
描述
Complete Very High Speed Sample-and-Hold Amplifier

AD783AQ 技术参数

是否Rohs认证: 不符合生命周期:Obsolete
零件包装代码:DIP包装说明:MINI, CERDIP-8
针数:8Reach Compliance Code:not_compliant
ECCN代码:EAR99HTS代码:8542.33.00.01
风险等级:5.73Is Samacsys:N
最长采集时间:0.25 µs标称采集时间:0.15 µs
放大器类型:SAMPLE AND HOLD CIRCUIT最大模拟输入电压:2.5 V
最小模拟输入电压:-2.5 V最大下降率:1 V/s
JESD-30 代码:R-GDIP-T8JESD-609代码:e0
负供电电压上限:-6.5 V标称负供电电压 (Vsup):-5 V
功能数量:1端子数量:8
最高工作温度:125 °C最低工作温度:-55 °C
封装主体材料:CERAMIC, GLASS-SEALED封装代码:DIP
封装等效代码:DIP8,.3封装形状:RECTANGULAR
封装形式:IN-LINE峰值回流温度(摄氏度):NOT SPECIFIED
电源:+-5 V认证状态:Not Qualified
采样并保持/跟踪并保持:SAMPLE座面最大高度:5.08 mm
子类别:Sample and Hold Circuits最大压摆率:14 mA
供电电压上限:6.5 V标称供电电压 (Vsup):5 V
表面贴装:NO技术:BIMOS
温度等级:MILITARY端子面层:Tin/Lead (Sn/Pb)
端子形式:THROUGH-HOLE端子节距:2.54 mm
端子位置:DUAL处于峰值回流温度下的最长时间:NOT SPECIFIED
宽度:7.62 mmBase Number Matches:1

AD783AQ 数据手册

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AD783  
T he AD783 does not provide separate analog and digital ground  
leads as is the case with most A-to-D converters. T he common  
pin is the single ground terminal for the device. It is the refer-  
ence point for the sampled input voltage and the held output  
voltage and also the digital ground return path. T he common  
pin should be connected to the reference (analog) ground of the  
A-to-D converter with a separate ground lead. Since the analog  
and digital grounds in the AD783 are connected internally, the  
common pin should also be connected to the digital ground,  
which is usually tied to analog common at the A-to-D converter.  
Figure 3 illustrates the recommended decoupling and grounding  
practice.  
T he accuracy in sampling high frequency signals is also  
constrained by the distortion and noise created by the  
sample-and-hold. T he level of distortion increases with  
frequency and reduces the “effective number of bits” of the  
conversion.  
Measurements of Figures 6 and 7 were made using a 14-bit  
A/D converter with VIN = 5 V p-p and a sample frequency of  
100 kSPS.  
1%  
1/2 BIT @  
8 BITS  
NO ISE CH ARACTERISTICS  
Designers of data conversion circuits must also consider the  
effect of noise sources on the accuracy of the data acquisition  
system. A sample-and-hold amplifier that precedes the A-to-D  
converter introduces some noise and represents another source  
of uncertainty in the conversion process. T he noise from the  
AD783 is specified as the total output noise, which includes  
both the sampled wideband noise of the SHA in addition to the  
band limited output noise. T he total output noise is the rms  
sum of the sampled dc uncertainty and the hold mode noise. A  
plot of the total output noise vs. the equivalent input bandwidth  
of the converter being used is given in Figure 4.  
0.1%  
1/2 BIT @  
10 BITS  
1/2 BIT @  
12 BITS  
APERTURE JITTER TYPICAL AT 20ps  
0.01%  
1/2 BIT @  
14 BITS  
1k  
10k  
100k  
1M  
FREQUENCY – Hz  
300  
200  
100  
0
Figure 5. Error Magnitude vs. Frequency  
–65  
–70  
–75  
–80  
–85  
–90  
1k  
10k  
100k  
1M  
10M  
FREQUENCY – Hz  
–95  
100  
1k  
10k  
100k  
1M  
Figure 4. RMS Noise vs. Input Bandwidth of ADC  
FREQUENCY – Hz  
D RIVING TH E ANALO G INP UTS  
Figure 6. Total Harm onic Distortion vs. Frequency  
For best performance, it is important to drive the AD783 analog  
input from a low impedance signal source. T his enhances the  
sampling accuracy by minimizing the analog and digital cross-  
talk. Signals which come from higher impedance sources (e.g.,  
over 5 k) will have a relatively higher level of crosstalk. For  
applications where signals have high source impedance, an  
operational amplifier buffer in front of the AD783 is required.  
T he AD711 (precision BiFET op amp) is recommended for  
these applications.  
90  
80  
70  
60  
50  
40  
30  
20  
10  
0
H IGH FREQ UENCY SAMP LING  
Aperture jitter and distortion are the primary factors which limit  
frequency domain performance of a sample-and-hold amplifier.  
Aperture jitter modulates the phase of the hold command and  
produces an effective noise on the sampled analog input. T he  
magnitude of the jitter induced noise is directly related to the  
frequency of the input signal.  
1k  
10k  
100k  
1M  
FREQUENCY – Hz  
A graph showing the magnitude of the jitter induced error vs.  
frequency of the input signal is given in Figure 5.  
Figure 7. Signal/(Noise and Distortion) vs. Frequency  
REV. A  
–7–  

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