AD5821A

更新时间： 2024-02-10 14:15:29

品牌	Logo	应用领域
亚德诺 - ADI		/
页数	文件大小	规格书
16页	433K
描述
120 mA, Current Sinking, 10-Bit, I2C DAC

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技术参数
数据手册

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AD5821A 技术参数

是否无铅：	含铅	是否Rohs认证：	符合
生命周期：	Contact Manufacturer	零件包装代码：	DIE
包装说明：	DIE,	针数：	0
Reach Compliance Code：	unknown	ECCN代码：	EAR99
HTS代码：	8542.39.00.01	风险等级：	5.78
Is Samacsys：	N	最大模拟输出电压：	5.5 V
最小模拟输出电压：	0.6 V	转换器类型：	D/A CONVERTER
输入位码：	BINARY	输入格式：	SERIAL
JESD-30 代码：	R-XUUC-N8	最大线性误差 (EL)：	0.3906%
位数：	10	功能数量：	1
端子数量：	8	最高工作温度：	85 °C
最低工作温度：	-40 °C	封装主体材料：	UNSPECIFIED
封装代码：	DIE	封装形状：	RECTANGULAR
封装形式：	UNCASED CHIP	认证状态：	Not Qualified
标称安定时间 (tstl)：	250 µs	标称供电电压：	3.6 V
表面贴装：	YES	温度等级：	INDUSTRIAL
端子形式：	NO LEAD	端子位置：	UPPER
Base Number Matches：	1

AD5821A 数据手册

AD5821A

TERMINOLOGY

Relative Accuracy

Digital-to-Analog Glitch Impulse

For the DAC, relative accuracy or integral nonlinearity (INL)

is a measurement of the maximum deviation, in LSB, from a

straight line passing through the endpoints of the DAC trans-

fer function. A typical INL vs. code plot is shown in Figure 5.

This is the impulse injected into the analog output when the

input code in the DAC register changes state. It is normally

specified as the area of the glitch in nanoampere seconds

(nA-sec) and is measured when the digital input code is

changed by 1 LSB at the major carry transition.

Differential Nonlinearity (DNL)

Differential nonlinearity is the difference between the measured

change and the ideal 1 LSB change between any two adjacent

codes. A specified differential nonlinearity of 1 LSB maximum

ensures monotonicity. This DAC is guaranteed monotonic by

design. A typical DNL vs. code plot is shown in Figure 6.

Digital Feedthrough

Digital feedthrough is a measurement of the impulse injected

into the analog output of the DAC from the digital inputs of

the DAC, but it is measured when the DAC output is not

updated. It is specified in nanoampere seconds (nA-sec) and

measured with a full-scale code change on the data bus, that is,

from all 0s to all 1s and vice versa.

Zero-Code Error

Zero-code error is a measurement of the output error when zero

code (0x0000) is loaded to the DAC register. Ideally, the output

is 0 mA. The zero-code error is always positive in the AD5821A

because the output of the DAC cannot go below 0 mA. This is

due to a combination of the offset errors in the DAC and output

amplifier. Zero-code error is expressed in milliamperes (mA).

Offset Error

Offset error is a measurement of the difference between I_SINK

(actual) and I_OUT(ideal) in the linear region of the transfer

function, expressed in milliamperes (mA). Offset error is

measured on the AD5821A with Code 16 loaded into the DAC

Gain Error

Gain error is a measurement of the span error of the DAC. It is

the deviation in slope of the DAC transfer characteristic from

the ideal, expressed as a percent of the full-scale range.

Offset Error Drift

Offset error drift is a measurement of the change in offset error

with a change in temperature. It is expressed in microvolts per

degree Celsius (μV/°C).

Gain Error Drift

Gain error drift is a measurement of the change in gain error

with changes in temperature. It is expressed in LSB/°C.

Rev. 0 | Page 10 of 16

1...7 8 91011 12 13...16

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与AD5821A相关器件

型号	品牌	获取价格	描述	数据表
AD5821ABCBZ-REEL	ADI	获取价格	120 mA, Current Sinking, 10-Bit, I2C DAC
AD5821ABCBZ-REEL7	ADI	获取价格	120 mA, Current Sinking, 10-Bit, I2C DAC
AD5821AD-WAFER	ADI	获取价格	120 mA, Current Sinking, 10-Bit, I2C DAC
AD5821A-WAFER	ADI	获取价格	120 mA, Current Sinking, 10-Bit, I2C DAC
AD5821BCBZ-REEL	ADI	获取价格	暂无描述
AD5821BCBZ-REEL1	ADI	获取价格	120 mA, Current Sinking, 10-Bit, I2C DAC
AD5821BCBZ-REEL7	ADI	获取价格	IC SERIAL INPUT LOADING, 250 us SETTLING TIME, 10-BIT DAC, PBGA9, LEAD FREE, WLCSP-9, Digi
AD5821BCBZ-REEL71	ADI	获取价格	120 mA, Current Sinking, 10-Bit, I2C DAC
AD5821D-WAFER	ADI	获取价格	120 mA, Current Sinking, 10-Bit, I2C DAC
AD5821-WAFER	ADI	获取价格	120 mA, Current Sinking, 10-Bit, I2C DAC

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