AD5539J

更新时间： 2024-01-23 07:49:21

品牌	Logo	应用领域
亚德诺 - ADI		运算放大器
页数	文件大小	规格书
16页	475K
描述
Ultrahigh Frequency Operational Amplifier

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AD5539J 技术参数

AD5539

Figure 38. Differential Phase vs. Ram p Am plitude

Figure 35. Differential Gain and Phase Measurem ent

Circuit

MEASURING AD 5539 SETTLING TIME

Measuring the very rapid settling times associated with AD5539

can be a real problem for the designer; proper component layout

must be used and appropriate test equipment selected. In addi-

tion, both cable dispersion (a function of cable losses) and the

quality of termination (SWR) directly affect the measurement.

T he circuit of Figure 39 was used to make a “brute force”

AD5539 settling time measurement. T he fixture containing the

circuit was connected directly—using a male BNC connector

(but no cable)—onto the front of a 50 Ω input oscilloscope

preamp. A digital mainframe was then used to capture, average,

and expand the error signal. Most of the small-scale waveform

aberrations shown on the figure were caused by the oscilloscope

itself, especially the glitch at 15 ns. T he pulse source used for

this measurement was an EH-SPG2000 pulse generator set for a

1 ns rise-time; it was coupled directly to the circuit using 18" of

microwave 50 Ω hard line.

Figure 36. Differential Gain and Phase Test Setup

Figure 37. Differential Gain vs. Ram p Am plitude

Figure 39. AD5539 Settling Tim e Test Circuit

–12–

REV. B

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型号	品牌	描述	获取价格	数据表
AD5539JCHIPS	ADI	AD5539JCHIPS	获取价格
AD5539JN	ADI	Ultrahigh Frequency Operational Amplifier	获取价格
AD5539JQ	ADI	Ultrahigh Frequency Operational Amplifier	获取价格
AD5539S	ADI	Ultrahigh Frequency Operational Amplifier	获取价格
AD5539SCHIPS	ADI	AD5539SCHIPS	获取价格
AD5539SQ	ADI	Ultrahigh Frequency Operational Amplifier	获取价格