AD5302/AD5312/AD5322
PIN FUNCTION DESCRIPTIONS
Pin No. Mnemonic
Function
1
LDAC
Active low control input that transfers the contents of the input registers to their respective DAC regis-
ters. Pulsing this pin low allows either or both DAC registers to be updated if the input registers have new
data. This allows simultaneous update of both DAC outputs
2
3
VDD
Power Supply Input. These parts can be operated from +2.5 V to +5.5 V and the supply should be de-
coupled to GND.
Reference Input Pin for DAC B. This is the reference for DAC B. It may be configured as a buffered or
an unbuffered input, depending on the BUF bit in the control word of DAC B. It has an input range
from 0 V to VDD in unbuffered mode and from 1 V to VDD in buffered mode.
Reference Input Pin for DAC A. This is the reference for DAC A. It may be configured as a buffered or
an unbuffered input depending on the BUF bit in the control word of DAC A. It has an input range from
0 V to VDD in unbuffered mode and from 1 V to VDD in buffered mode.
V
V
REFB
4
REFA
5
6
7
V
V
OUTA
OUTB
Buffered Analog Output Voltage from DAC A. The output amplifier has rail-to-rail operation.
Buffered Analog Output Voltage from DAC B. The output amplifier has rail-to-rail operation.
Active Low Control Input. This is the frame synchronization signal for the input data. When SYNC goes
low, it powers on the SCLK and DIN buffers and enables the input shift register. Data is transferred in
on the falling edges of the following 16 clocks. If SYNC is taken high before the 16th falling edge, the
rising edge of SYNC acts as an interrupt and the write sequence is ignored by the device.
SYNC
8
SCLK
Serial Clock Input. Data is clocked into the input shift register on the falling edge of the serial clock in-
put. Data can be transferred at rates up to 30 MHz. The SCLK input buffer is powered down after each
write cycle.
9
DIN
Serial Data Input. This device has a 16-bit input shift register. Data is clocked into the register on the
falling edge of the serial clock input. The DIN input buffer is powered down after each write cycle.
10
GND
Ground reference point for all circuitry on the part.
GAIN ERROR DRIFT
This is a measure of the change in gain error with changes in tem-
perature. It is expressed in (ppm of full-scale range)/°C.
TERMINOLOGY
RELATIVE ACCURACY
For the DAC, relative accuracy or Integral Nonlinearity (INL)
is a measure of the maximum deviation, in LSBs, from a straight
line passing through the actual endpoints of the DAC transfer
function. A typical INL vs. code plot can be seen in Figure 4.
MAJOR-CODE TRANSITION GLITCH ENERGY
Major-code transition glitch energy is the energy of the impulse
injected into the analog output when the code in the DAC regis-
ter changes state. It is normally specified as the area of the glitch
in nV-secs and is measured when the digital code is changed by
1 LSB at the major carry transition (011 . . . 11 to 100 . . . 00 or
100 . . . 00 to 011 . . . 11).
DIFFERENTIAL NONLINEARITY
Differential Nonlinearity (DNL) is the difference between the
measured change and the ideal 1 LSB change between any two
adjacent codes. A specified differential nonlinearity of ±1 LSB
maximum ensures monotonicity. This DAC is guaranteed
monotonic by design. A typical DNL vs. code plot can be seen
in Figure 7.
DIGITAL FEEDTHROUGH
Digital feedthrough is a measure of the impulse injected into the
analog output of the DAC from the digital input pins of the
device, but is measured when the DAC is not being written to
(SYNC held high). It is specified in nV-secs and is measured
with a full-scale change on the digital input pins, i.e., from all 0s
to all 1s and vice versa.
OFFSET ERROR
This is a measure of the offset error of the DAC and the output
amplifier. It is expressed as a percentage of the full-scale range.
GAIN ERROR
ANALOG CROSSTALK
This is a measure of the span error of the DAC. It is the devia-
tion in slope of the actual DAC transfer characteristic from the
ideal expressed as a percentage of the full-scale range.
This is the glitch impulse transferred to the output of one DAC
due to a change in the output of the other DAC. It is measured
by loading one of the input registers with a full-scale code change
(all 0s to all 1s and vice versa) while keeping LDAC high. Then
pulse LDAC low and monitor the output of the DAC whose
digital code was not changed. The area of the glitch is expressed
in nV-secs.
OFFSET ERROR DRIFT
This is a measure of the change in offset error with changes in
temperature. It is expressed in (ppm of full-scale range)/°C.
REV. 0
–5–
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