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AD5320BRTZ-500RL7 PDF预览

AD5320BRTZ-500RL7

更新时间: 2024-01-03 21:59:21
品牌 Logo 应用领域
罗彻斯特 - ROCHESTER 输入元件光电二极管转换器
页数 文件大小 规格书
21页 1121K
描述
SERIAL INPUT LOADING, 12 us SETTLING TIME, 12-BIT DAC, PDSO8, LEAD FREE, MO-187AA, SOT-23, 6 PIN

AD5320BRTZ-500RL7 技术参数

是否无铅: 含铅是否Rohs认证: 符合
生命周期:Active零件包装代码:TSSOP
包装说明:LSSOP, TSOP6,.11,37针数:6
Reach Compliance Code:compliantECCN代码:EAR99
HTS代码:8542.39.00.01风险等级:1.11
最大模拟输出电压:5.5 V最小模拟输出电压:
转换器类型:D/A CONVERTER输入位码:BINARY
输入格式:SERIALJESD-30 代码:R-PDSO-G8
JESD-609代码:e3长度:2.9 mm
最大线性误差 (EL):0.3906%湿度敏感等级:1
位数:12功能数量:1
端子数量:8最高工作温度:105 °C
最低工作温度:-40 °C封装主体材料:PLASTIC/EPOXY
封装代码:LSSOP封装等效代码:TSOP6,.11,37
封装形状:RECTANGULAR封装形式:SMALL OUTLINE, LOW PROFILE, SHRINK PITCH
峰值回流温度(摄氏度):260电源:3/5 V
认证状态:Not Qualified座面最大高度:1.45 mm
最大稳定时间:10 µs标称安定时间 (tstl):12 µs
子类别:Other Converters最大压摆率:0.25 mA
标称供电电压:3 V表面贴装:YES
技术:CMOS温度等级:INDUSTRIAL
端子面层:Matte Tin (Sn)端子形式:GULL WING
端子节距:0.95 mm端子位置:DUAL
处于峰值回流温度下的最长时间:40宽度:1.65 mm
Base Number Matches:1

AD5320BRTZ-500RL7 数据手册

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AD5320  
TERMINOLOGY  
Relative Accuracy  
Total Unadjusted Error  
For the DAC, relative accuracy or integral nonlinearity (INL) is  
a measure of the maximum deviation, in LSBs, from a straight  
line passing through the endpoints of the DAC transfer  
function. A typical INL vs. code plot can be seen in Figure 5.  
Total unadjusted error (TUE) is a measure of the output error  
considering all the various errors. A typical TUE vs. code plot  
can be seen in Figure 7.  
Zero-Code Error Drift  
Differential Nonlinearity  
This is a measure of the change in zero-code error with a  
change in temperature. It is expressed in μV/°C.  
Differential nonlinearity (DNL) is the difference between the  
measured change and the ideal 1 LSB change between any two  
adjacent codes. A specified differential nonlinearity of 1 LSB  
maximum ensures monotonicity. This DAC is guaranteed  
monotonic by design. A typical DNL vs. code plot can be seen  
in Figure 6.  
Gain Error Drift  
This is a measure of the change in gain error with changes in  
temperature. It is expressed in (ppm of full-scale range)/°C.  
Digital-to-Analog Glitch Impulse  
Digital-to-analog glitch impulse is the impulse injected into the  
analog output when the input code in the DAC register changes  
state. It is normally specified as the area of the glitch in nV  
seconds and is measured when the digital input code is changed  
by 1 LSB at the major carry transition (7FF Hex to 800 Hex); see  
Figure 22.  
Zero-Code Error  
Zero-code error is a measure of the output error when zero  
code (000 hex) is loaded to the DAC register. Ideally, the output  
should be 0 V. The zero-code error is always positive in the  
AD5320 because the output of the DAC cannot go below 0 V  
due to a combination of the offset errors in the DAC and output  
amplifier. Zero-code error is expressed in mV. A plot of zero-  
code error vs. temperature can be seen in Figure 9.  
Digital Feedthrough  
Digital feedthrough is a measure of the impulse injected into  
the analog output of the DAC from the digital inputs of the  
DAC but is measured when the DAC output is not updated. It  
is specified in nV seconds and measured with a full-scale code  
change on the data bus, that is, from all 0s to all 1s and vice  
versa.  
Full-Scale Error  
Full-scale error is a measure of the output error when full-scale  
code (FFF Hex) is loaded to the DAC register. Ideally the output  
should be VDD − 1 LSB. Full-scale error is expressed in percent  
of full-scale range. A plot of full-scale error vs. temperature can  
be seen in Figure 9.  
Gain Error  
This is a measure of the span error of the DAC. It is the  
deviation in slope of the DAC transfer characteristic from ideal  
expressed as a percent of the full-scale range.  
Rev. C | Page 7 of 20  
 

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