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AD5254BRUZ10-RL7 PDF预览

AD5254BRUZ10-RL7

更新时间: 2024-02-13 22:33:38
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亚德诺 - ADI 电位器存储
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32页 576K
描述
Quad 64-/256-Position I2C Nonvolatile Memory Digital Potentiometers

AD5254BRUZ10-RL7 数据手册

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Data Sheet  
AD5253/AD5254  
INTERFACE TIMING CHARACTERISTICS  
All input control voltages are specified with tR = tF = 2.5 ns (10% to 90% of 3 V) and timed from a voltage level of 1.5 V. Switching  
characteristics are measured using both VDD = 3 V and 5 V.  
Table 3.  
Parameter1  
Symbol  
Conditions  
Min Typ2 Max Unit  
INTERFACE TIMING  
SCL Clock Frequency  
tBUF Bus-Free Time Between Stop and Start t1  
fSCL  
400  
kHz  
μs  
μs  
1.3  
0.6  
tHD;STA Hold Time (Repeated Start)  
t2  
After this period, the first clock pulse is  
generated.  
tLOW Low Period of SCL Clock  
t3  
t4  
t5  
t6  
t7  
t8  
t9  
t10  
1.3  
0.6  
0.6  
0
μs  
μs  
μs  
μs  
ns  
ns  
ns  
μs  
ms  
μs  
tHIGH High Period of SCL Clock  
tSU;STA Set-up Time for Start Condition  
tHD;DAT Data Hold Time  
0.9  
tSU;DAT Data Set-up Time  
100  
tF Fall Time of Both SDA and SCL Signals  
tR Rise Time of Both SDA and SCL Signals  
tSU;STO Set-up Time for Stop Condition  
EEMEM Data Storing Time  
EEMEM Data Restoring Time at Power-On3 tEEMEM_RESTORE1 VDD rise time dependent. Measure without  
decoupling capacitors at VDD and VSS.  
300  
300  
0.6  
tEEMEM_STORE  
26  
300  
EEMEM Data Restoring Time upon Restore tEEMEM_RESTORE2 VDD = 5 V.  
300  
540  
μs  
μs  
Command or Reset Operation3  
EEMEM Data Rewritable Time4  
FLASH/EE MEMORY RELIABILITY  
Endurance5  
tEEMEM_REWRITE  
100  
K cycles  
Years  
Data Retention6, 7  
100  
1 See Figure 23 for location of measured values.  
2 Typical values represent average readings at 25°C and VDD = 5 V.  
3 During power-up, all outputs are preset to midscale before restoring the EEMEM contents. RDAC0 has the shortest EEMEM restore time, whereas RDAC3 has the longest.  
4 Delay time after power-on or reset before new EEMEM data to be written.  
5 Endurance is qualified to 100,000 cycles per JEDEC Std. 22 Method A117 and measured at –40°C, +25°C, and +105°C; typical endurance at +25°C is 700,000 cycles.  
6 Retention lifetime equivalent at junction temperature TJ = 55°C per JEDEC Std. 22, Method A117. Retention lifetime based on an activation energy of 0.6 eV derates  
with junction temperature.  
7 When the part is not in operation, the SDA and SCL pins should be pulled high. When these pins are pulled low, the I2C interface at these pins conducts a current of  
about 0.8 mA at VDD = 5.5 V and 0.2 mA at VDD = 2.7 V.  
Rev. C | Page 7 of 32  
 
 

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