Datasheet > AD5162

AD5162

更新时间： 2022-12-11 21:10:54

品牌	Logo	应用领域
亚德诺 - ADI		数字电位计
页数	文件大小	规格书
20页	1116K
描述
Dual 256-Position SPI Digital Potentiometer

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数据手册

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AD5162 数据手册

AD5162

TEST CIRCUITS

Figure 27 through Figure 32 illustrate the test circuits that

define the test conditions used in the product specification

tables.

V+ = V ± 10%

∆V

DUT

PSRR (dB) = 20 LOG

(

)

∆V

PSS (%/%) =

V+ = V

1LSB = V+/2

DUT

V+

Figure 30. Test Circuit for Power Supply Sensitivity

(PSS, PSSR)

Figure 27. Test Circuit for Potentiometer Divider Nonlinearity Error

(INL, DNL)

DUT

+15V

NO CONNECT

DUT

AD8610

–15V

OUT

OFFSET

GND

2.5V

Figure 31. Test Circuit for Gain vs. Frequency

Figure 28. Test Circuit for Resistor Position Nonlinearity Error

(Rheostat Operation; R-INL, R-DNL)

DUT

= V /R

DD NOMINAL

GND

MS2

= [V

– V

]/I

MS2 W

MS1

NC NC = NO CONNECT

Figure 32. Test Circuit for Common-Mode Leakage Current

Figure 29. Test Circuit for Wiper Resistance

Rev. A | Page 12 of 20

1...9 10 111213 14 15...20

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