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AD22284-A-R2 PDF预览

AD22284-A-R2

更新时间: 2024-02-20 18:18:54
品牌 Logo 应用领域
亚德诺 - ADI /
页数 文件大小 规格书
12页 202K
描述
Dual-Axis, High-g, MEMS Accelerometers

AD22284-A-R2 技术参数

是否无铅: 含铅是否Rohs认证: 符合
生命周期:Obsolete零件包装代码:LCC
包装说明:LCC-8针数:8
Reach Compliance Code:not_compliantECCN代码:EAR99
HTS代码:8542.39.00.01风险等级:8.55
模拟集成电路 - 其他类型:ANALOG CIRCUITJESD-30 代码:S-CQCC-N8
长度:5 mm功能数量:2
端子数量:8最高工作温度:105 °C
最低工作温度:-40 °C封装主体材料:CERAMIC, METAL-SEALED COFIRED
封装代码:QCCN封装等效代码:LCC8,.2SQ
封装形状:SQUARE封装形式:CHIP CARRIER
峰值回流温度(摄氏度):260电源:5 V
认证状态:Not Qualified座面最大高度:2.2 mm
子类别:Other Analog ICs最大供电电压 (Vsup):5.25 V
最小供电电压 (Vsup):4.75 V标称供电电压 (Vsup):5 V
表面贴装:YES温度等级:INDUSTRIAL
端子面层:Tungsten/Nickel/Gold (W/Ni/Au)端子形式:NO LEAD
端子节距:1.27 mm端子位置:QUAD
处于峰值回流温度下的最长时间:40宽度:5 mm
Base Number Matches:1

AD22284-A-R2 数据手册

 浏览型号AD22284-A-R2的Datasheet PDF文件第1页浏览型号AD22284-A-R2的Datasheet PDF文件第2页浏览型号AD22284-A-R2的Datasheet PDF文件第3页浏览型号AD22284-A-R2的Datasheet PDF文件第5页浏览型号AD22284-A-R2的Datasheet PDF文件第6页浏览型号AD22284-A-R2的Datasheet PDF文件第7页 
ADXL278  
ABSOLUTE MAXIMUM RATINGS  
Table 2.  
Stresses above those listed under Absolute Maximum Ratings  
may cause permanent damage to the device. This is a stress  
rating only; functional operation of the device at these or any  
other conditions above those indicated in the operational  
section of this specification is not implied. Exposure to absolute  
maximum rating conditions for extended periods may affect  
device reliability.  
Parameter  
Rating  
Acceleration (Any Axis, Unpowered)  
Acceleration (Any Axis, Powered)  
VS  
4,ꢀꢀꢀ g  
4,ꢀꢀꢀ g  
−ꢀ.3 V to +7.ꢀ V  
(COM − ꢀ.3 V) to  
(VS + ꢀ.3 V)  
All Other Pins  
Output Short-Circuit Duration  
(Any Pin to Common)  
Indefinite  
Operating Temperature Range  
Storage Temperature  
−65°C to +15ꢀ°C  
−65°C to +15ꢀ°C  
ESD CAUTION  
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4ꢀꢀꢀ V readily accumulate on the  
human body and test equipment and can discharge without detection. Although this product features  
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy  
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance  
degradation or loss of functionality.  
Rev. A | Page 4 of 12  
 

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