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ACST1035-8FP PDF预览

ACST1035-8FP

更新时间: 2023-12-20 18:44:12
品牌 Logo 应用领域
意法半导体 - STMICROELECTRONICS 开关
页数 文件大小 规格书
13页 466K
描述
过压保护10 A 800 V交流开关

ACST1035-8FP 数据手册

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ACST1035-8FP  
Figure 8: Non repetitive surge peak on-state  
Characteristics  
Figure 9: Relative variation of gate trigger current  
and gate trigger voltage versus junction  
temperature (typical values)  
current for a sinusoidal pulse with width tp < 10 ms  
ITSM(A), I2t (A2s)  
1000  
T initial = 25°C  
j
I
dI/dt limitation: 100 A/µs  
TSM  
100  
10  
1
tp(ms)  
0.01  
0.10  
1.00  
10.00  
Figure 10: Relative variation of holding current and  
latching current versus junction temperature  
(typical values)  
Figure 11: Relative variation of critical rate of  
decrease of main current (dI/dt)c versus reapplied  
(dV/dt)c  
(dl/dt)c[(dV/dt)c] / specified (dl/dt)c  
3
Tj = 150 °C  
2
1
(dV/dt)c (V/µs)  
100.0  
0
0.1  
1.0  
10.0  
Figure 12: Relative variation of critical rate of  
decrease of main current versus junction  
temperature (typical values)  
Figure 13: Relative variation of static dV/dt  
immunity versus junction temperature  
dV/dt[T ] / dV/dt[T = 150 °C]  
j
j
5
4
3
2
1
0
(dI/dt)C [Tj] / (dI/dt)c [Tj = 150 °C]  
10  
VD = VR = 536 V  
9
8
7
6
5
(dV/dt) > 5KV/µs  
4
3
2
1
Tj(°C)  
T (°C)  
j
0
25  
50  
75  
100  
125  
150  
25  
50  
75  
100  
125  
150  
DocID025321 Rev 2  
5/13  

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