Datasheet > ACS20K/SAMPLE

ACS20K/SAMPLE

更新时间： 2024-02-01 11:58:29

品牌	Logo	应用领域
瑞萨 - RENESAS		输入元件逻辑集成电路
页数	文件大小	规格书
8页	87K
描述
AC SERIES, DUAL 4-INPUT NAND GATE, CDFP14, CERAMIC, DFP-14

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技术参数
数据手册

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ACS20K/SAMPLE 技术参数

生命周期：	Obsolete	零件包装代码：	DFP
包装说明：	DFP,	针数：	14
Reach Compliance Code：	unknown	HTS代码：	8542.39.00.01
风险等级：	5.05	系列：	AC
JESD-30 代码：	R-CDFP-F14	逻辑集成电路类型：	NAND GATE
功能数量：	2	输入次数：	4
端子数量：	14	封装主体材料：	CERAMIC, METAL-SEALED COFIRED
封装代码：	DFP	封装形状：	RECTANGULAR
封装形式：	FLATPACK	传播延迟（tpd）：	12 ns
认证状态：	Not Qualified	座面最大高度：	2.92 mm
最大供电电压 (Vsup)：	5.5 V	最小供电电压 (Vsup)：	4.5 V
标称供电电压 (Vsup)：	5 V	表面贴装：	YES
技术：	CMOS	端子形式：	FLAT
端子节距：	1.27 mm	端子位置：	DUAL
宽度：	6.285 mm	Base Number Matches：	1

ACS20K/SAMPLE 数据手册

Speciﬁcations ACS20MS

TABLE 6. APPLICABLE SUBGROUPS

CONFORMANCE GROUPS

Initial Test (Preburn-In)

METHOD

100%/5004

Sample/5005

GROUP A SUBGROUPS

READ AND RECORD

ICC, IOL/H

1, 7, 9

Interim Test 1 (Postburn-In)

Interim Test 2 (Postburn-In)

PDA

ICC, IOL/H

1, 7, 9

1, 7, 9, Deltas

1, 7, 9

Interim Test 3 (Postburn-In)

PDA

ICC, IOL/H

1, 7, 9, Deltas

2, 3, 8A, 8B, 10, 11

1, 2, 3, 7, 8A, 8B, 9, 10, 11

1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas

1, 7, 9

Final Test

Group A (Note 1)

Group B

Subgroup B-5

Subgroup B-6

Subgroups 1, 2, 3, 9, 10, 11

Group D

NOTE:

1, 7, 9

1. Alternate Group A testing may be exercised in accordance with MIL-STD-883, Method 5005.

TABLE 7. TOTAL DOSE IRRADIATION

TEST

READ AND RECORD

CONFORMANCE GROUP

Group E Subgroup 2

NOTE:

METHOD

PRE RAD

POST RAD

PRE RAD

1, 9

POST RAD

5005

1, 7, 9

Table 4

Table 4 (Note 1)

1. Except FN test which will be performed 100% Go/No-Go.

TABLE 8. BURN-IN TEST CONNECTIONS (+125 C < TA < 139 C)

OSCILLATOR

OPEN

GROUND

1/2 VCC = 3V ±0.5V

VCC = 6V ±0.5V

50kHz

25kHz

STATIC 1 BURN-IN (Notes 1, 2)

1, 2, 4, 5, 7, 9, 10,

12, 13

3, 6, 8, 11

STATIC 2 BURN-IN (Notes 1, 2)

3, 6, 8, 11

1, 2, 4, 5, 9,

10, 12, 13

DYNAMIC BURN-IN (Notes 1, 2)

1, 2, 4, 5, 9,

10, 12, 13

NOTES:

1. Each lead except VCC and GND will have a series resistor of 500Ω ±5%.

2. No-connect pins 3 and 11 may be connected to any voltage level.

TABLE 9. IRRADIATION TEST CONNECTIONS

FUNCTION

Irradiation Circuit (Note 1)

NOTE:

OPEN

GROUND

VCC = 5V ±0.5V

1, 2, 4, 5, 9, 10, 11, 12, 13, 14

3, 6, 8, 11

1. Each pin except VCC and GND will have a series resistor of 47kΩ ±5%. Group E, Subgroup 2, sample size is 4 dice/wafer, 0 failures.

Spec Number 518815

1 2 345 6 7 8

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