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A42L2604V-50UF PDF预览

A42L2604V-50UF

更新时间: 2024-01-15 12:39:56
品牌 Logo 应用领域
联笙电子 - AMICC /
页数 文件大小 规格书
25页 261K
描述
EDO DRAM, 4MX4, 50ns, CMOS, PDSO24

A42L2604V-50UF 技术参数

是否Rohs认证: 符合生命周期:Obsolete
包装说明:TSOP, TSOP24/26,.36Reach Compliance Code:unknown
风险等级:5.84最长访问时间:50 ns
I/O 类型:COMMONJESD-30 代码:R-PDSO-G24
内存密度:16777216 bit内存集成电路类型:EDO DRAM
内存宽度:4端子数量:24
字数:4194304 words字数代码:4000000
最高工作温度:85 °C最低工作温度:-40 °C
组织:4MX4输出特性:3-STATE
封装主体材料:PLASTIC/EPOXY封装代码:TSOP
封装等效代码:TSOP24/26,.36封装形状:RECTANGULAR
封装形式:SMALL OUTLINE, THIN PROFILE电源:3.3 V
认证状态:Not Qualified刷新周期:2048
自我刷新:YES最大待机电流:0.001 A
子类别:DRAMs最大压摆率:0.075 mA
标称供电电压 (Vsup):3.3 V表面贴装:YES
技术:CMOS温度等级:INDUSTRIAL
端子形式:GULL WING端子节距:1.27 mm
端子位置:DUALBase Number Matches:1

A42L2604V-50UF 数据手册

 浏览型号A42L2604V-50UF的Datasheet PDF文件第7页浏览型号A42L2604V-50UF的Datasheet PDF文件第8页浏览型号A42L2604V-50UF的Datasheet PDF文件第9页浏览型号A42L2604V-50UF的Datasheet PDF文件第11页浏览型号A42L2604V-50UF的Datasheet PDF文件第12页浏览型号A42L2604V-50UF的Datasheet PDF文件第13页 
A42L2604 Series  
Notes:  
1. ICC1, ICC3, ICC4, and ICC5 depend on cycle rate.  
2. ICC1 and ICC4 depend on output loading. Specified values are obtained with the outputs open.  
3. An initial pause of 200ms is required after power-up followed by any 8 RAS cycles before proper device operation is  
achieved. In the case of an internal refresh counter, a minimum of 8 CAS -before-RAS initialization cycles instead of 8  
RAS cycles are required. 8 initialization cycles are required after extended periods of bias without clocks.  
4. AC Characteristics assume tT = 2ns. All AC parameters are measured with a load equivalent to two TTL loads and  
50pF, VIL (min.) ³ GND and VIH (max.) £ VCC.  
5. VIH (min.) and VIL (max.) are reference levels for measuring timing of input signals. Transition times are measured  
between VIH and VIL.  
6. Operation within the tRCD (max.) limit insures that tRAC (max.) can be met. tRCD (max.) is specified as a reference  
point only. If tRCD is greater than the specified tRCD (max.) limit, then access time is controlled exclusively by tCAC.  
7. Operation within the tRAD (max.) limit insures that tRAC (max.) can be met. tRAD (max.) is specified as a reference  
point only. If tRAD is greater than the specified tRAD (max.) limit, then access time is controlled exclusively by tAA.  
8. Assumes three state test load (5pF and a 500W Thevenin equivalent).  
9. Either tRCH or tRRH must be satisfied for a read cycle.  
10. tOFF (max.) defines the time at which the output achieves the open circuit condition; it is not referenced to output  
voltage levels.  
11. tWCS, tWCH, tRWD, tCWD and tAWD are not restrictive operating parameters. They are included in the data sheet  
as electrical characteristics only. If tWCS ³ tWCS (min.) and tWCH ³ tWCH (min.), the cycle is an early write cycle  
and data-out pins will remain open circuit, high impedance, throughout the entire cycle. If tRWD ³ tRWD (min.) , tCWD ³  
tCWD (min.) and tAWD ³ tAWD (min.), the cycle is a read-modify-write cycle and the data out will contain data read from  
the selected cell. If neither of the above conditions is satisfied, the condition of the data out at access time is  
indeterminate.  
12. Access time is determined by the longer of tAA or tCAC or tCPA.  
13. tASC ³ tCP to achieve tPC (min.) and tCPA (max.) values.  
PRELIMINARY  
(June, 2002, Version 0.3)  
9
AMIC Technology, Inc.  

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