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A1280A-1PGG176E PDF预览

A1280A-1PGG176E

更新时间: 2024-01-19 22:53:28
品牌 Logo 应用领域
ACTEL 时钟可编程逻辑
页数 文件大小 规格书
98页 2005K
描述
Field Programmable Gate Array, 1232 CLBs, 8000 Gates, 60MHz, CMOS, CPGA176, CERAMIC, PGA-176

A1280A-1PGG176E 技术参数

是否Rohs认证: 符合生命周期:Transferred
包装说明:CERAMIC, PGA-176Reach Compliance Code:compliant
风险等级:5.77其他特性:MAX 140 I/OS
最大时钟频率:60 MHzCLB-Max的组合延迟:5.2 ns
JESD-30 代码:S-CPGA-P176JESD-609代码:e4
长度:39.878 mm可配置逻辑块数量:1232
等效关口数量:8000端子数量:176
最高工作温度:125 °C最低工作温度:-55 °C
组织:1232 CLBS, 8000 GATES封装主体材料:CERAMIC, METAL-SEALED COFIRED
封装代码:PGA封装形状:SQUARE
封装形式:GRID ARRAY峰值回流温度(摄氏度):245
可编程逻辑类型:FIELD PROGRAMMABLE GATE ARRAY认证状态:Not Qualified
座面最大高度:4.7498 mm最大供电电压:5.5 V
最小供电电压:4.5 V标称供电电压:5 V
表面贴装:NO技术:CMOS
温度等级:MILITARY端子面层:GOLD
端子形式:PIN/PEG端子节距:2.54 mm
端子位置:PERPENDICULAR处于峰值回流温度下的最长时间:40
宽度:39.878 mm

A1280A-1PGG176E 数据手册

 浏览型号A1280A-1PGG176E的Datasheet PDF文件第5页浏览型号A1280A-1PGG176E的Datasheet PDF文件第6页浏览型号A1280A-1PGG176E的Datasheet PDF文件第7页浏览型号A1280A-1PGG176E的Datasheet PDF文件第9页浏览型号A1280A-1PGG176E的Datasheet PDF文件第10页浏览型号A1280A-1PGG176E的Datasheet PDF文件第11页 
Actel MIL-STD-883 Product Flow  
883—Class B  
Requirement  
Step  
Screen  
883 Method  
1.  
2.  
3.  
Internal Visual  
2010, Test Condition B  
1010, Test Condition C  
100%  
100%  
100%  
Temperature Cycling  
Constant Acceleration  
2001, Test Condition D or E,  
Y1, Orientation Only  
4.  
Seal  
1014  
a. Fine  
b. Gross  
100%  
100%  
5.  
6.  
Visual Inspection  
2009  
100%  
100%  
Pre-Burn-In  
Electrical Parameters  
In accordance with applicable Actel  
device specification  
7.  
Burn-in Test  
1015, Condition D,  
160 hours @ 125°C or 80 hours @ 150°C  
100%  
100%  
8.  
Interim (Post-Burn-In)  
Electrical Parameters  
In accordance with applicable Actel  
device specification  
9.  
Percent Defective Allowable  
Final Electrical Test  
5%  
All Lots  
10.  
In accordance with applicable Actel  
device specification, which includes a, b, and c:  
a. Static Tests  
100%  
100%  
(1) 25°C  
(Subgroup 1, Table I)  
(2) –55°C and +125°C  
(Subgroups 2, 3, Table I)  
5005  
5005  
b. Functional Tests  
(1) 25°C  
(Subgroup 7, Table I)  
(2) –55°C and +125°C  
(Subgroups 8A and 8B, Table I)  
5005  
5005  
c. Switching Tests at 25°C  
(Subgroup 9, Table I)  
100%  
100%  
5005  
2009  
11.  
External Visual  
Note: When Destructive Physical Analysis (DPA) is performed on Class B devices, the step coverage requirement as specified in Method 2018  
must be waived.  
8

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